Memory Die Failure Detection Using Consecutive Blockstripe Errors

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Solution Overview

Problem

Conventional methods for detecting die failure in memory sub-systems are inadequate as they fail to accurately track block failures, leading to ineffective handling of program failures, especially in high-capacity memory devices, resulting in potential dead loops and drive hangs.

Innovation Solution

Implement a die failure detection method using channel CPUs to monitor program failures across multiple blockstripes, incrementing a program failure count for each die experiencing consecutive failures, and initiating a retirement process when the count reaches a threshold.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional methods are used to detect die failure, then the system structure remains simple, but the reliability of die failure detection deteriorates due to inaccurate block failure tracking

Engineering Contradiction:
Improvedie failure detection accuracyVSAvoidblock failure tracking complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the memory device into multiple blockstripes, each associated with a specific die. By tracking program failures at the blockstripe level rather than individual blocks, the system achieves accurate die failure detection while reducing tracking complexity. Each blockstripe serves as a representative unit that, when failed, indicates die-level failure without requiring monitoring of every individual block within the die.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If all blocks are monitored for failure, then measurement precision improves, but the loss of time increases due to extensive monitoring requirements

Engineering Contradiction:
Improveblock failure tracking precisionVSAvoidtime for monitoring blocks
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

Instead of monitoring every individual block within a die, the patent implements partial monitoring by selecting and monitoring only one representative block per blockstripe. This partial action approach maintains sufficient measurement precision for die failure detection while dramatically reducing the time and computational resources required compared to exhaustive block-level monitoring.

Inventive Principle:
Principle #16Partial or excessive action

3Speed

If program failure count threshold is set low, then the speed of die failure detection improves, but the loss of substance increases due to retirement of good dies

Engineering Contradiction:
Improvedie failure detection speedVSAvoidretirement of good dies
Core Design Contradiction:
SpeedVSLoss of substance

Solution Approach 1:

The patent implements a preliminary verification step before retiring a die by checking whether the program failure is isolated to a single blockstripe or persists across multiple consecutive blockstripes. This preliminary action of verifying consecutive failures across multiple blockstripes prevents premature retirement of good dies while maintaining fast detection speed through the use of a threshold-based counting mechanism.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20260064528A1Detecting die failure in memory sub-systems
Publication Date: 2026.03.05 MICRON TECHNOLOGY INC
  • US20260064528A1 patent drawing
  • US20260064528A1 patent drawing
  • US20260064528A1 patent drawing

AI summary

A plurality of commands comprising data to be written to a plurality of blockstripes, each blockstripe comprising at least one block from each of a plurality of memory devices, can be received from a high-speed processing device. Based on determining a first memory device associated with a first blockstripe experiences program failure in response to execution of a first command, whether a second memory device associated with a second blockstripe experiences program failure in response to execution of a second command, can be determined. Based on detecting consecutive program failure on the memory device, whether a program failure count associated with the memory device satisfies a program failure threshold can be determined. Based on determining the program failure count associated with the memory device satisfies the program failure threshold, retirement of the memory device can be initiated.