Memory Die Temperature Adjustment for Aging
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Solution Overview
Problem
Memory dies in storage devices experience degradation due to increased traps over time, leading to higher program and erase pulses, which reduces storage capacity and marks dies as erroneous, existing methods like rejuvenation and temperature monitoring do not effectively address these issues.
Innovation Solution
A system and method for controlling memory die temperature by detecting aging conditions through trap increases, performing a healing process that includes temperature adjustments to reduce traps, thereby limiting capacity loss and maintaining storage capacity.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Duration of action of stationary object
If memory dies are used continuously over time, then storage device operates, but traps increase in storage elements causing program and erase pulses to increase
Solution Approach 1:
The patent applies periodic rejuvenation cycles where memory dies undergo heating treatments at intervals during normal operation. The controller periodically initiates heating sequences that raise the temperature of affected memory dies to facilitate trap release, then allows cooling periods. This periodic action maintains storage element performance by regularly clearing accumulated traps without requiring continuous intervention.
Solution Approach 2:
The patent changes the temperature parameter of memory dies dynamically. During normal operation, dies operate at standard temperatures. When degradation is detected or periodically scheduled, the controller increases the temperature parameter through controlled heating, which alters the physical state of traps in the storage elements, enabling electron emission and trap neutralization.
2Reliability
If a higher number of traps is present in storage elements, then program and erase pulses increase, but storage capacity is reduced and dies are marked as erroneous
Solution Approach 1:
The patent converts the harmful effect of accumulated traps into a beneficial process. By detecting increased trap levels through rising program and erase pulse counts, the system triggers heating sequences that exploit thermal energy to release trapped electrons. This transforms the harmful trap accumulation into an opportunity for rejuvenation, where the same operational stress that created traps also provides the mechanism (increased electron activity at higher temperatures) to eliminate them.
Solution Approach 2:
The patent implements feedback control where the controller monitors the number of program and erase pulses required for storage operations. When pulse counts exceed thresholds indicating trap accumulation, the system automatically initiates heating sequences. After heating, the controller continues monitoring pulse requirements to verify improvement, creating a closed-loop feedback system that dynamically adjusts maintenance operations based on actual storage element conditions.
3Reliability
If memory dies are heated to reduce traps, then aging effects are reversed, but additional energy is consumed
Solution Approach 1:
The patent applies partial heating rather than uniformly heating all memory dies continuously. Only specific memory dies that show signs of degradation or are scheduled for rejuvenation receive heating treatment. The heating is applied for sufficient duration to achieve trap release, then stopped, avoiding unnecessary energy consumption on already healthy storage elements.
Solution Approach 2:
The patent performs preliminary detection of trap accumulation through monitoring program and erase pulse counts before initiating heating. This preliminary assessment allows the system to target only those memory dies that actually require rejuvenation, preventing wasted energy on dies that do not need treatment. The controller prepares heating sequences in advance based on detected conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The proposed solution effectively reduces the number of program and erase pulses, reverses aging effects, and limits the number of erroneous memory dies, maintaining storage capacity over time by heating the memory die to detrap electrons and reduce charge traps.
Implementation Method 1
perform memory operations to increase a temperature of the memory die until detecting a temperature condition related to the temperature of the memory die
Implementation Method 2
heating the memory die to detrap electrons and reduce charge traps
Data Source
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AI summary
A device includes a memory device and a controller. The controller is configured to, responsive to determining that the memory device has a particular characteristic, increase the temperature of the first die by performing memory operations on the first die until detecting a condition related to the temperature.