Memory Die ntODT Triggering Across Multi-CE Channels
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Solution Overview
Problem
Existing storage devices face performance degradation due to cumbersome toggling between target and non-target dies on channels with multiple chip enables (CEs) and the need for multiple write-protect pins, which increase cost and complexity.
Innovation Solution
A controller triggers non-target on-die termination (ntODT) on non-target dies by using chip enable (CE) and command latch enable (CLE) signals, eliminating the need for write-protect pins and reducing power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If command-based triggers are used to enable ODT and non-target ODT, then the number of dies connected to a channel can be increased, but the performance of the storage device deteriorates due to cumbersome toggling between target and non-target dies
Solution Approach 1:
The non-target dies automatically detect their own status as non-target dies by listening to the command signal and address of the target die, and autonomously enable/disable non-target ODT without requiring explicit control signals from the controller or target die. This self-service mechanism eliminates the cumbersome toggling operation and maintains high performance while supporting multiple dies on a channel.
2Adaptability or versatility
If a write-protect pin is provided per channel to enable ODT and non-target ODT, then the controller can trigger non-target ODT in different channels, but the cost and controller size increase
Solution Approach 1:
The controller uses the existing CE signal and command signal infrastructure to enable non-target ODT across all channels, rather than requiring separate write-protect pins for each channel. The single write-protect pin services every die in the system by leveraging the multi-functional CE and command signal mechanisms, achieving universal applicability without increasing controller complexity or cost.
3Quantity of substance
If multiple chip enable (CE) switches/buckets are used on a channel, then more dies can be associated with the channel, but the complexity of switching between target and non-target dies increases
Solution Approach 1:
Non-target dies on different CE buckets automatically identify themselves as non-target dies by listening to the command signal and address from the target die, and autonomously enable non-target ODT without requiring the controller to manage complex switching states. This self-service approach simplifies the system architecture while supporting multiple CE buckets and numerous dies on the channel.
Data Source
AI summary
A storage device may trigger a non-target on-die termination (ntODT) on non-target dies in a memory device. A controller on the storage device may send a command to a target die. When a memory device including the target die and the non-target dies, receives a chip enable (CE) signal, the target die and non-target dies listen to the command. If the communication channel includes one CE bucket, the non-target dies in the CE bucket use the address of the target die to determine that they are non-target dies. If the communication channel includes more than one CE buckets, the non-target dies in a CE bucket that does not include the target die, use a command trigger to determine that they are non-target dies. The non-target dies turn on the ntODT during data transmission and turn off the ntODT when the data transmission is complete.