Stacked Memory Die Power Switching for Standby Current Isolation
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Solution Overview
Problem
Existing semiconductor memory devices face challenges in efficiently identifying and isolating memory dies with high standby currents, leading to increased power consumption and difficulty in failure analysis due to shared power supply lines.
Innovation Solution
The semiconductor memory device employs independently controllable switch elements for each memory die, allowing separate application of power supply voltage, enabling identification and isolation of memory dies with high standby currents.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If multiple memory dies share common power supply lines, then device complexity is reduced, but identification and isolation of memory dies with high standby currents becomes difficult
Solution Approach 1:
The patent divides the common power supply line into separate power supply lines for each memory die by introducing switch elements. This segmentation allows independent control of power supply to each memory die, enabling precise identification and isolation of defective memory dies without increasing overall system complexity
2Ease of manufacture
If multiple memory dies share common power supply lines, then manufacturing simplicity is maintained, but power consumption cannot be optimized
Solution Approach 1:
The patent introduces switch elements that can dynamically control the power supply state of each memory die independently. This dynamic control enables the system to optimize power consumption by isolating memory dies with high standby currents while maintaining manufacturing simplicity through a modular switch integration approach
3Difficulty of detecting and measuring
If independently controllable switch elements are added for each memory die, then identification and isolation of high standby current memory dies is improved, but device complexity increases
Solution Approach 1:
The switch elements serve multiple functions: they enable independent power supply control, facilitate standby current measurement, and allow isolation of defective memory dies. This multi-functionality justifies the added complexity by eliminating the need for separate testing equipment and procedures
Data Source
AI summary
A semiconductor memory device includes a first memory die, a second memory die disposed above the first memory die via adhesives, a first wiring connected to the first memory die, and configured to apply a power supply voltage to the first memory die, a first switch element connected to the first wiring, a second wiring connected to the second memory die, and configured to apply the power supply voltage to the second memory die, a second switch element connected to the second wiring, and a third wiring configured to electrically connect to the first wiring via the first switch element, and configured to electrically connect to the second wiring via the second switch element. The first switch element and the second switch element are independently controllable.


