Memory Die Programming Control Using Fail-Count-Based Precharge Adjustment
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The probability of failure and reduced lifespan in specific memory dies due to increased program failures and prolonged program operation times in memory systems are not adequately addressed by existing technologies.
Innovation Solution
A memory system with a memory controller that tracks program fail counts for each memory die and adjusts operation parameters, such as precharge times for bit lines, based on these counts to prevent performance deterioration and extend lifespan.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the memory controller continues to use default operation parameters for memory dies with high program failure rates, then the program operation speed is maintained, but the program failure count increases and lifespan deteriorates
Solution Approach 1:
The patent applies dynamics by making operation parameters adjustable and adaptive rather than fixed. The memory controller dynamically modifies bit line precharge time based on the program fail count of each memory die, allowing the system to adapt operation conditions to the actual state of memory dies. This resolves the contradiction by enabling the system to switch between speed optimization and reliability protection modes.
Solution Approach 2:
The patent directly applies parameter changes by modifying the bit line precharge time parameter in response to program fail count thresholds. When the program fail count exceeds a threshold, the controller increases the precharge time to improve program success rate. This parameter adjustment resolves the contradiction by trading off some operation speed to achieve higher reliability when needed.
2Reliability
If the memory controller increases the bit line precharge time for memory dies with high program failure rates, then the program operation reliability improves, but the program operation time increases
Solution Approach 1:
The patent applies local quality by implementing differentiated operation parameters for different memory dies based on their individual program fail counts. Instead of uniformly increasing precharge time for all memory dies, the controller selectively adjusts parameters only for memory dies that exhibit high failure rates. This resolves the contradiction by localizing the time penalty only to problematic memory dies while maintaining fast operation for healthy dies.
Solution Approach 2:
The patent implements feedback by continuously monitoring program fail counts for each memory die and using this information to adjust operation parameters. The controller receives feedback about program operation outcomes and modifies bit line precharge time accordingly. This feedback mechanism resolves the contradiction by ensuring time increases only when actually needed to improve reliability, rather than permanently slowing down all operations.
3Duration of action of stationary object
If the memory controller monitors and adjusts operation parameters for each memory die individually, then the lifespan and performance are optimized, but the control complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the memory device into multiple independently managed memory dies, each with its own program fail count tracking and parameter adjustment. The controller maintains separate management information for each die, allowing individualized optimization without requiring complex cross-die coordination. This segmentation approach resolves the contradiction by making the complexity manageable through modular, die-level independent control.
Solution Approach 2:
The patent implements self-service by enabling each memory die to effectively manage its own operational parameters based on its performance history. The controller automatically tracks program fail counts and adjusts parameters without external intervention or complex decision-making algorithms. This self-service mechanism resolves the contradiction by reducing controller complexity through automated, rule-based parameter adjustment rather than requiring sophisticated control systems.
Data Source
AI summary
Embodiments of the present disclosure relate to a memory system and an operating method of the memory system. According to embodiments of the present disclosure, a memory system may store, for each of the plurality of memory dies, a program fail count indicating a cumulative number of occurrences of a program fail during a program operation for each memory die, and may change, for a target memory die among the plurality of memory dies, a first operation parameter among operation parameters applied to the target memory die when executing a program operation on the target memory die, based on a target program fail count which is the program fail count for the target memory die.