Memory-Die Radiation Sensor Suite for Targeted NAND Error Correction

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Solution Overview

Problem

Existing memory devices are susceptible to performance degradation and functionality issues due to radiation exposure, leading to read errors and requiring time-consuming system reboots for correction.

Innovation Solution

Incorporation of a radiation sensor suite on non-volatile memory dies to detect and correct specific radiation events, allowing targeted corrections to affected areas without full system reboot.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If radiation sensors are added to memory dies, then radiation event detection capability is improved, but device complexity increases

Engineering Contradiction:
Improveradiation event detection capabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the radiation sensing function with the existing memory die structure by integrating radiation sensors directly into the memory die. This combination allows the memory device to detect radiation events while maintaining its primary storage function, thereby improving reliability without requiring a completely separate sensing system.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The memory die is designed to serve multiple functions: data storage and radiation detection. The radiation sensors share the same physical substrate and power infrastructure as the memory cells, allowing the device to perform both memory operations and radiation monitoring using unified resources.

Inventive Principle:
Principle #6Universality (Multi-functionality)

2Reliability

If full system reboot is performed for radiation correction, then data integrity is restored, but loss of time increases

Engineering Contradiction:
Improvedata integrityVSAvoidsystem downtime
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent segments the memory device into functional zones with individual radiation sensors monitoring specific regions. When radiation damage is detected, only the affected segment needs correction rather than requiring a complete system reboot, thereby reducing downtime while maintaining data integrity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The radiation sensors continuously monitor for radiation events and trigger corrections before they cause widespread damage. This preliminary detection and response mechanism prevents the need for full system reboots by addressing radiation effects at their source, reducing overall system downtime.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If radiation sensors monitor continuously, then radiation events are detected promptly, but use of energy increases

Engineering Contradiction:
Improveradiation event detection timelinessVSAvoidenergy consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The radiation sensors operate in a periodic monitoring mode, checking for radiation events at defined intervals rather than continuously. This periodic action maintains reliable detection capability while significantly reducing energy consumption compared to continuous monitoring, as the sensors can enter low-power states between monitoring cycles.

Inventive Principle:
Principle #19Periodic action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Facilitates rapid and energy-efficient correction of radiation-induced memory issues, minimizing downtime and maintaining device functionality.

Implementation Method 1

The charge induction effect is utilized to sense the presence of ionizing radiation.

Methodology Applied
Scientific EffectCharge induction: Electrical Resistance

Data Source

PatentUS20250383945A1Radiation sensor suite
Publication Date: 2025.12.18 MICRON TECHNOLOGY INC
  • US20250383945A1 patent drawing
  • US20250383945A1 patent drawing
  • US20250383945A1 patent drawing

AI summary

The present disclosure includes apparatuses, methods, and systems for a radiation sensor suite. In an example, a method can include calibrating a plurality of sensors of a sensor suite located on a non-volatile memory die and monitoring for a plurality of radiation events at each one of the plurality of sensors. In response to none of the plurality of sensors detecting a radiation event, the method can include the sensor suite continuing to monitor for the plurality of radiation events. In response to at least one of the plurality of radiation sensors detecting a radiation event, the method can include notifying a host of the radiation event and identifying a NAND flash memory array region affected and correcting the radiation event based on the radiation event and the NAND flash memory array region affected.