Nonvolatile Memory Drive Defect Detection via Read-Back Management
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Solution Overview
Problem
Conventional semiconductor memory management systems cannot detect defects in clusters with normal bits after shipment, leading to potential failures in exact data storage and reproduction.
Innovation Solution
An information processing apparatus with a nonvolatile semiconductor memory drive that includes a control module to manage data read and write operations in units of sectors, detecting errors and storing defective sector information in a management table to ensure exact data write and read operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If discrimination information is created only at factory shipment, then product cost is suppressed, but defects occurring after shipment cannot be detected
Solution Approach 1:
The patent performs preliminary defect detection by reading back data immediately after writing it to the semiconductor memory, before the memory is shipped or used. This preliminary action captures defect information early, allowing the system to adapt subsequent data storage operations based on detected defects, thereby improving reliability without requiring complex ongoing monitoring systems.
Solution Approach 2:
The patent implements a feedback mechanism where defect information detected during write operations is fed back into the system to update management information. This feedback loop enables the system to learn from detected defects and adjust future data allocation decisions, improving defect detection capability while maintaining manageable system complexity through iterative learning.
2Reliability
If all clusters are treated as normal, then data allocation is simplified, but exact storage and reproduction cannot be guaranteed after shipment
Solution Approach 1:
The patent segments the semiconductor memory into individual clusters and evaluates each cluster's defect status independently. By dividing the memory into manageable units with distinct defect characteristics, the system can make precise data allocation decisions for each cluster, ensuring exact storage guarantees for critical data while maintaining efficient overall data allocation through automated management.
Solution Approach 2:
The patent applies local quality assessment by determining defect status for each individual cluster rather than treating the entire memory uniformly. This allows the system to identify specific defective clusters and allocate data accordingly, ensuring high reliability for data requiring exact storage while maintaining allocation efficiency through localized defect management rather than global restrictions.
3Reliability
If inexpensive semiconductor memory with unguaranteed quality is used, then product cost is suppressed, but defect occurrence after shipment increases
Solution Approach 1:
The patent implements self-service defect detection where the semiconductor memory system automatically performs read-back operations to detect its own defects without requiring external quality assurance mechanisms. This self-diagnostic capability enables inexpensive memory devices to achieve post-shipment defect detection, compensating for lower initial quality guarantees through automated self-monitoring.
Solution Approach 2:
The patent performs preliminary defect detection operations immediately after data writing, capturing defect information before the memory is deployed. This preliminary assessment of inexpensive memory devices allows the system to identify and flag defective clusters early, enabling reliable data storage decisions despite using cost-effective memory components with lower initial quality guarantees.
Data Source
AI summary
According to one embodiment, an information processing apparatus includes an information processing apparatus main body, and a nonvolatile semiconductor memory drive. The semiconductor memory drive includes a control module configured to control execution of data read and write on a nonvolatile semiconductor memory in units of a predetermined number of sectors. In a case where a data size of write data from the information processing apparatus main body is less than a data size of the predetermined number of sectors, the control module reads, from the nonvolatile semiconductor memory, data in a predetermined number of sectors including a sector in which the write data is to be written, and in a case where an error is detected in the read data, the control module stores, in a management table, defective sector information which is indicative of a sector storing the data in which the error is detected.