Memory Array Dummy Data Generation for Higher Write Throughput

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Solution Overview

Problem

Existing memory systems face inefficiencies in generating and transmitting dummy data, which is time-consuming and affects throughput.

Innovation Solution

The memory device generates dummy data internally based on its own characteristics without receiving it from the controller, using set feature commands or flags in write commands to indicate dummy data generation, and includes algorithms to manage dummy data operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the memory controller transmits dummy data to the memory device, then the dummy data can be written to specified locations, but the transmission time increases and throughput decreases

Engineering Contradiction:
Improvedummy data writing reliabilityVSAvoidsystem throughput
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The memory device autonomously generates dummy data using its internal random number generator or adjacent data, eliminating the need for external transmission from the memory controller. This self-service approach resolves the contradiction by maintaining reliable dummy data writing while eliminating transmission time overhead, thereby improving system throughput

Inventive Principle:
Principle #25Self-service

2Productivity

If the memory device generates dummy data internally, then transmission time is reduced and throughput is enhanced, but the device complexity increases

Engineering Contradiction:
Improvesystem throughputVSAvoidmemory device complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The memory device uses its existing internal resources (random number generator or adjacent data storage) to generate dummy data, avoiding the need for additional external components. This resolves the contradiction by achieving throughput enhancement through internal generation while minimizing increases in device complexity by leveraging existing device capabilities

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The memory device changes the source parameter of dummy data from external transmission to internal generation, utilizing available internal resources such as random number generators or adjacent data. This parameter change enables throughput improvement while keeping complexity increases minimal by using existing device functionality

Inventive Principle:
Principle #35Parameter changes

3Productivity

If dummy data is generated using adjacent data and algorithms, then the coupling effect is utilized to improve performance, but the manufacturing precision requirements increase

Engineering Contradiction:
Improveprogramming performanceVSAvoiddata generation precision
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent changes the approach from transmitting external dummy data to generating it internally using adjacent data and algorithms that account for coupling effects. This resolves the contradiction by improving programming performance through intelligent data generation while managing manufacturing precision requirements through software-based algorithms rather than hardware precision constraints

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentEP4506945B1Memory device and operation method therefor, and memory system
Publication Date: 2026.03.04 YANGTZE MEMORY TECH CO LTD
  • EP4506945B1 patent drawingFigure 1~2a
  • EP4506945B1 patent drawingFigure 2b~3a
  • EP4506945B1 patent drawingFigure 3b~4

AI summary

Examples of the present disclosure provide a memory device, an operation method thereof, and a memory system. The memory device includes: a memory cell array and a peripheral circuit coupled to the memory cell array. The operation method of the memory device includes: receiving a first instruction indicating to write dummy data at a specified location in the memory cell array; generating the dummy data to be written in response to the first instruction; and writing the dummy data to be written at the specified location.