Memory ECC Layout Using Latin Square Codeword Distribution

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Solution Overview

Problem

Conventional ECC-XOR schemes in memory sub-systems are limited by the worst quality die, restricting codeword length and error correction power, leading to sub-optimal error correction capabilities.

Innovation Solution

The proposed ECC-XOR layout assigns a single codeword to multiple dies, dividing it into segments and arranging them in a Latin Square layout across different dies, allowing for longer codewords and improved error correction by averaging die quality, thus enhancing failure tolerance and error correction power.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional ECC-XOR schemes use single die for codeword storage, then die failure probability increases, but codeword length is restricted and error correction power is limited

Engineering Contradiction:
Improveerror correction capabilityVSAvoidcodeword length
Core Design Contradiction:
ReliabilityVSLength of moving object

Solution Approach 1:

The patent divides a single codeword into multiple segments and distributes them across multiple dies in a Latin Square pattern. Each die stores only a portion of the codeword, allowing the system to achieve longer effective codeword length while maintaining error correction capability. This segmentation resolves the contradiction by enabling longer codewords without concentrating all segments in a single die, thus improving both reliability and codeword length simultaneously.

Inventive Principle:
Principle #1Segmentation

2Reliability

If ECC-XOR scheme is limited by worst quality die, then error correction power is restricted, but system complexity increases

Engineering Contradiction:
Improvefailure toleranceVSAvoidlayout complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent introduces a Latin Square dimensional arrangement where codeword segments are distributed across multiple dies in a structured grid pattern. This dimensional approach allows the system to average die quality across multiple dies rather than being constrained by the single worst die, improving failure tolerance while maintaining manageable complexity through the systematic Latin Square organization.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If codeword is divided and distributed across multiple dies, then error correction power improves, but data retrieval complexity increases

Engineering Contradiction:
Improveerror correction powerVSAvoiddata retrieval
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent pre-arranges codeword segments in a Latin Square pattern across multiple dies during the encoding phase. This preliminary structured distribution ensures that when data retrieval is needed, the controller can systematically reconstruct the complete codeword by collecting segments from the appropriate dies according to the known Latin Square pattern, simplifying the retrieval process despite the distributed storage.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS11438012B2Failure-tolerant error correction layout for memory sub-systems
Publication Date: 2022.09.06 MICRON TECHNOLOGY INC
  • US11438012B2 patent drawing
  • US11438012B2 patent drawing
  • US11438012B2 patent drawing

AI summary

Codewords of an error correcting code can be received. The codewords can be separated into multiple segments. The segments of the codewords can be distributed in an error correcting layout across a plurality of dies where at least a portion of the error correcting layout constitutes a Latin Square (LS) layout.