Memory ECC Mode Switching Based on Array Temperature
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Solution Overview
Problem
Current error correction techniques in memory systems are inefficient in managing temperature-dependent error rates, leading to increased power consumption and reduced reliability due to fixed error correction modes that do not adapt to varying temperature conditions.
Innovation Solution
Implementing a temperature-dependent, multiple mode error correction system that dynamically switches between high and low temperature modes by using a temperature sensor to adjust the error correction code length, thereby optimizing error detection and correction capabilities while minimizing power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fixed error correction mode is used, then the error detection and correction capability is maintained at a constant level, but the power consumption increases and reliability decreases under varying temperature conditions
Solution Approach 1:
The patent implements dynamic error correction by switching between different ECC modes (first mode with higher correction capability and second mode with lower correction capability) based on temperature sensor readings. This allows the system to adapt its error correction strength to current temperature conditions, reducing power consumption when high correction capability is not needed while maintaining reliability when temperature increases cause higher error rates.
Solution Approach 2:
The system changes the error correction parameter (ECC mode) based on temperature conditions. The temperature sensor monitors the memory device temperature, and the controller adjusts the ECC mode accordingly - using stronger error correction at higher temperatures and weaker correction at lower temperatures, thereby optimizing the balance between reliability and power consumption.
2Reliability
If a fixed error correction mode is used, then the system complexity is reduced, but the adaptability to temperature-dependent error rates deteriorates
Solution Approach 1:
The patent introduces dynamic adaptability by implementing temperature-dependent ECC mode switching. The system includes a temperature sensor and controller that automatically adjust the error correction mode based on real-time temperature measurements, enabling the system to adapt to varying error rates caused by temperature changes without requiring complex manual configuration.
Solution Approach 2:
The error correction system performs self-adjustment by using the temperature sensor to monitor conditions and automatically selecting the appropriate ECC mode. This self-service mechanism eliminates the need for external intervention or complex control logic, as the system autonomously optimizes its error correction capability based on environmental conditions.
3Reliability
If error correction is continuously performed at high level, then reliability is improved, but power consumption increases unnecessarily at low temperatures
Solution Approach 1:
The system dynamically changes the error correction parameter (ECC mode) based on temperature conditions. At low temperatures where error rates are naturally lower, the system switches to a second ECC mode with reduced correction capability, thereby reducing power consumption. At high temperatures where error rates increase, the system switches to a first ECC mode with higher correction capability to maintain data integrity.
Solution Approach 2:
The patent applies partial error correction by using a reduced ECC mode (second mode) when temperature conditions permit. Instead of always applying full-strength error correction, the system uses just enough correction capability appropriate for current conditions, avoiding the excessive power consumption that would result from continuously applying high-level error correction regardless of temperature.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces power consumption by adapting error correction modes to temperature changes, enhancing error detection and correction capabilities at both high and low temperatures, thus improving memory system reliability and efficiency.
Implementation Method 1
a temperature sensor coupled to the array and configured to provide an output signal which is a function of the temperature of the array of memory cells
Data Source
Figure 1
Figure 2a~2b
Figure 3a
AI summary
In one embodiment, temperature dependent, multiple mode error correction in accordance with one aspect of this disclosure, is employed for a memory circuit containing arrays of memory cells. In one embodiment, a temperature sensor coupled to an array is configured to provide an output signal which is a function of the temperature of the array of memory cells. Multiple mode error correction code (ECC) logic having an input coupled to an output of the temperature sensor, is configured to encode write data and decode read data for the array of memory cells in an error correction code in one of a plurality of error correction modes as a function of the temperature of the array of memory cells. Other aspects are described herein.