Memory ECS Control Circuit for High-Speed Error Scrubbing

The patent applies preliminary action by performing error check operations before data transmission completes and by proactively generating ECS commands based on refresh command counts. The error check execution signal generation circuit prepares error check signals in advance, and the ECS control circuit generates correction commands before errors propagate, thereby maintaining high speed while ensuring reliability through preemptive error handling.

The patent implements feedback mechanisms where the error check execution signal generation circuit monitors transmission status and generates error check signals based on feedback from the transmission process. The ECS control circuit receives feedback from error detection results and dynamically generates ECS active commands and ECS read commands to correct errors, creating a closed-loop system that maintains reliability at high speeds.

The patent applies local quality by performing error check operations only on specific memory regions where errors are detected or suspected, rather than uniformly across the entire memory. The select address generation circuit identifies and targets only the affected memory cells for error correction, concentrating computational resources and power consumption on local error-prone areas while leaving other regions untouched, thus maintaining reliability while reducing overall power consumption.

The patent segments the memory error check process into targeted operations on specific memory regions. The ECS control circuit divides the error correction task by generating commands for specific memory segments identified by the select address generation circuit, rather than processing the entire memory space uniformly. This segmentation allows power-efficient error handling focused only on problematic areas.

The patent applies universality by designing the ECS control circuit to perform multiple functions: generating ECS active commands, generating ECS read commands, managing error check operations, and coordinating with the select address generation circuit. This multi-functional design consolidates what could be separate complex circuits into a unified controller, improving error correction capability while managing device complexity through functional integration.

The patent merges the error check execution signal generation circuit with the ECS control circuit to create an integrated error handling system. The select address generation circuit is also merged with the ECS control logic, allowing coordinated generation of commands and address selection in a unified control structure. This merging reduces overall device complexity by eliminating the need for separate dedicated circuits for each function.