Memory Element Temperature Estimation via Bit Probability
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Solution Overview
Problem
Existing temperature determination methods in electronic applications require a separate temperature sensor, which can be absent or malfunctioning, preventing temperature measurement.
Innovation Solution
Utilizing the temperature-dependent probability of bit value assumption in memory elements, such as SRAM or DRAM cells, to determine temperature without a separate sensor by triggering and processing the bit values of these elements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a separate temperature sensor is used to determine temperature, then temperature measurement can be performed, but the system requires additional components and increases device complexity
Solution Approach 1:
The memory elements are made to serve dual purposes: storing data and sensing temperature. By exploiting the temperature-dependent probability of bit value assumption in memory elements, the system uses existing components for both their primary function (data storage) and temperature measurement, eliminating the need for separate temperature sensors.
Solution Approach 2:
The memory elements themselves provide the temperature sensing function without requiring external assistance. The inherent temperature-dependent behavior of memory elements is utilized to generate temperature information, making the system self-sufficient for temperature measurement.
2Measurement precision
If a separate temperature sensor is used, then temperature can be determined, but reliability decreases when the sensor is absent or malfunctioning
Solution Approach 1:
By making memory elements multi-functional (data storage + temperature sensing), the system eliminates single-point failures associated with dedicated temperature sensors. The temperature measurement capability is distributed across multiple memory elements, providing redundancy and continued operation even if individual elements fail.
Solution Approach 2:
The invention exploits changes in the probability parameter of bit value assumption in memory elements as a function of temperature. This parameter change provides a reliable indicator of temperature that is inherently tied to the memory elements' operation, ensuring temperature measurement remains available as long as the memory elements are functional.
3Device complexity
If memory elements are used for temperature determination, then device complexity is reduced, but measurement precision must be maintained through proper processing
Solution Approach 1:
The temperature measurement is performed by segmenting the problem across multiple memory elements rather than using a single sensor. By collecting bit value information from many memory elements and processing the distribution, the system achieves precise temperature determination through statistical analysis, compensating for individual element variations.
Solution Approach 2:
The system uses feedback from the observed bit value distribution in memory elements to determine temperature. The processing circuitry analyzes the probability distribution of bit values and uses this feedback information to calculate temperature, ensuring accurate measurement through proper signal processing.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables temperature determination without a separate sensor, providing an accurate and reliable method for temperature measurement in electronic systems, with calibration enhancing accuracy in applications where temperature dependency is variable.
Implementation Method 1
a plurality of memory elements having a temperature-dependent probability of assuming a particular bit value
Data Source
AI summary
The invention relates to a method for determining a temperature (T) of a plurality of memory elements (10) having a temperature-dependent probability (P) of assuming a particular bit value, the method comprising: triggering (110) the plurality of memory elements (10) to assume the particular bit value; reading out (120) the contents of the plurality of memory elements (10) to obtain read data (D), and processing (130) the read data (D) for determining a value (Vact) indicative of the temperature (T). The invention also relates to a program product comprising instructions for causing a processor to perform the method. Such computer program is advantageously used in a smartcard, which then does not need any structural modification at all. The invention further relates to a system for determining a temperature (T) of a plurality of memory elements (10). Such system is advantageously implemented in an integrated circuit, wherein the plurality of memory elements (10) forms part of an integrated memory. The invention provides that temperature (T) can be determined without the need for a separate temperature sensor. The only real requirement is the presence of a plurality of memory elements (10) having a temperature-dependent probability (P) of assuming particular bit value.