Memory System Error Control Segmentation for Data Reliability

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Solution Overview

Problem

Conventional memory systems face challenges in reliably storing and retrieving user data due to errors caused by noise or impairments, as they often encode user and system data using the same error control operation, which limits error correction capabilities when errors exceed the correction threshold.

Innovation Solution

Implementing an additional error control operation specifically for storing critical data, such as temperature values, that assists in determining the optimal read voltage levels for user data, allowing for improved error correction and reduced errors during read operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If the same error control operation is used for both user data and system data, then the device complexity is reduced, but the reliability of user data storage deteriorates when errors exceed the correction threshold

Engineering Contradiction:
Improveerror control operation complexityVSAvoiduser data storage reliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent segments the error control operations into two distinct types: a first error control operation for user data and a second error control operation for critical system data. This segmentation allows each data type to be protected by an error control operation optimized for its specific requirements, thereby improving overall reliability without unduly complicating the system architecture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent applies local quality by using different error control operations for different data types. Critical system data that requires higher reliability (such as temperature values used for read voltage determination) is protected by a more robust second error control operation, while user data uses a standard first error control operation. This localized optimization ensures that critical data receives enhanced protection where it is most needed.

Inventive Principle:
Principle #3Local quality

2Reliability

If an additional error control operation is implemented for critical data, then the reliability of user data storage is improved, but the device complexity increases

Engineering Contradiction:
Improveuser data storage reliabilityVSAvoiderror control operation complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent extracts critical system data from the general system data set and applies a dedicated second error control operation specifically to this extracted critical data. By isolating and separately protecting only the most critical information (such as temperature values), the system achieves enhanced reliability for user data retrieval without applying complex error control operations to all data, thereby limiting the increase in device complexity.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent implements partial action by applying the more robust second error control operation only to critical system data rather than to all system data or user data. This selective application provides enhanced reliability protection exactly where it is most needed (for temperature values that determine read voltage levels) while avoiding the unnecessary complexity that would result from applying the same level of error control to all data in the system.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If error correction capabilities are enhanced for critical data, then errors during read operations are reduced, but the loss of time for error correction processing increases

Engineering Contradiction:
Improveerror correction capabilityVSAvoiderror correction processing time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent applies partial action by using the more time-consuming but more capable second error control operation only for critical system data, while the faster first error control operation handles user data. This approach reduces errors during read operations for critical temperature values without incurring excessive time losses across all data processing, as the enhanced error correction is applied selectively only where it provides the most benefit.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS11726874B2Storing critical data at a memory system
Publication Date: 2023.08.15 MICRON TECHNOLOGY INC
  • US11726874B2 patent drawing
  • US11726874B2 patent drawing
  • US11726874B2 patent drawing

AI summary

A request to retrieve user data stored at a memory device is received and a first error control operation associated with the user data is performed. An indication of a failure of the first error control operation is received, and in response, a subset of system data stored at the memory device is identified. A second error control operation is performed on the subset of the system data to retrieve the subset of the system data stored at the memory device, and the user data is read by using the subset of the system data retrieved based on the performing of the second error control operation.