Memory Controller Error Pattern Analysis for Chip and Pin Failures
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Solution Overview
Problem
Existing memory systems often inefficiently apply error-correcting code (ECC) without distinguishing between different types of memory failures, leading to unnecessary replacement of memory modules due to undifferentiated error correction.
Innovation Solution
A memory controller system that discriminates between chip failures and pin failures by analyzing corrupted symbol patterns in ECC codewords, allowing for targeted error correction and reduced ECC overhead, compatible with buffered memory systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If ECC is applied uniformly to all memory errors, then memory error detection capability is improved, but memory module replacement efficiency deteriorates due to unnecessary replacements
Solution Approach 1:
The patent segments memory errors into different categories (chip failures vs. pin failures) and applies differentiated handling strategies. By analyzing error patterns and identifying the specific failure type, the system can determine whether a memory module replacement is actually necessary, thus avoiding unnecessary replacements while maintaining reliable error detection.
2Reliability
If ECC corrects all errors without discrimination, then error correction coverage is improved, but system resource utilization deteriorates due to unnecessary corrections
Solution Approach 1:
The patent applies local quality by treating different error types differently. Instead of uniformly correcting all errors, the system analyzes error patterns to identify whether corrections are actually needed. This localized approach ensures that correction resources are consumed only when necessary, improving overall system resource utilization while maintaining adequate error correction coverage.
3Ease of operation
If memory errors are not discriminated, then error handling simplicity is improved, but diagnostic precision deteriorates leading to incorrect failure identification
Solution Approach 1:
The patent implements self-service by enabling the memory system to automatically analyze error patterns and identify failure types without external intervention. The system uses error signature analysis to self-diagnose whether errors stem from chip failures or pin failures, maintaining operational simplicity while significantly improving diagnostic precision through automated pattern recognition.
Data Source
AI summary
A system includes a memory controller, a buffer, a first channel to couple the memory controller to the buffer, and a second channel to couple the buffer to a memory. The first channel and second channel are to transmit a codeword including a plurality of symbols. A symbol is formed from a plurality of bursts based on data access of the memory. The memory controller is to identify a memory error based on a corrupted symbol pattern of the codeword. The memory controller is to discriminate between a chip failure, a first pin failure of the first channel, and a second pin failure of the second channel, as being a type of the memory error, according to the corrupted symbol pattern.