Memory Fail Indicator with LED Visual Feedback

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Solution Overview

Problem

Current memory systems lack effective mechanisms to quickly and accurately indicate failures, such as the location and type of errors, which hinders swift identification and replacement of faulty components, relying on system-level software for decoding failure information.

Innovation Solution

Incorporating a fail indicator, like a light-emitting diode (LED) connected via a side channel, that can be activated by the host device or BIOS to provide visual feedback on failure occurrence, type, and location, using color, duration, and brightness to indicate specific failure information.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If system-level software is used to decode failure information, then failure data can be retrieved, but the time required to identify and locate faulty components increases

Engineering Contradiction:
Improvefailure location identificationVSAvoidtime to identify and replace faulty components
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces the mechanical/software-based failure decoding process with an optical indication system. LEDs provide direct visual feedback about failure locations and types, eliminating the need for system-level software intervention and manual decoding processes.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The memory system performs self-diagnosis and self-indication of failure conditions. The system automatically detects failures and activates appropriate LED indicators without requiring external software assistance, enabling operators to quickly identify issues through direct visual observation.

Inventive Principle:
Principle #25Self-service

2Loss of information

If detailed failure information is stored in memory, then comprehensive diagnostic data is available, but the complexity of accessing and interpreting this information increases

Engineering Contradiction:
Improvefailure information availabilityVSAvoidsoftware decoding complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The patent extracts the essential failure information from complex stored data and presents it through simple LED indicators. The detailed failure information remains stored in memory, but the critical diagnostic data is separated and displayed visually, eliminating the need for complex software interpretation.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent uses color-coded LED indicators to represent different failure types and locations. This visual encoding system translates complex failure data into intuitive color signals, making diagnostic information immediately accessible without requiring software decoding or technical interpretation.

Inventive Principle:
Principle #32Color changes

3Productivity

If visual failure indicators are implemented, then failure detection speed increases, but the device complexity and manufacturing cost increase

Engineering Contradiction:
Improvefailure detection speedVSAvoidmemory system complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent employs LEDs, which are inexpensive and simple components, to provide visual failure indication. These low-cost optical indicators deliver high-value diagnostic information without significantly increasing system complexity or manufacturing costs, representing a cost-effective solution for rapid failure detection.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Facilitates faster detection and resolution of memory system failures by providing immediate visual cues to administrators, reducing the time and cost associated with identifying and replacing faulty components.

Implementation Method 1

Incorporating a fail indicator, like a light-emitting diode (LED) connected via a side channel, that can be activated by the host device or BIOS to provide visual feedback on failure occurrence

Methodology Applied
Scientific EffectLight-emitting diode: Light Emitting Diode

Data Source

PatentUS20240070007A1Memory with fail indicators, including memory with LED fail indicators, and associated systems, devices, and methods
Publication Date: 2024.02.29 MICRON TECHNOLOGY INC
  • US20240070007A1 patent drawing
  • US20240070007A1 patent drawing
  • US20240070007A1 patent drawing

AI summary

Memory with fail indicators, and associated systems, devices, and methods are disclosed herein. In one embodiment, a system includes a plurality of memory systems and a host device. At least one of the memory systems includes a fail indicator connected to the host device via a side channel of the system. The host device is configured to detect an occurrence of a failure on the at least one memory system and to initiate activation of the fail indicator. The side channel can be an I2C or I3C side channel. The fail indicator, when activated, can provide a visual indication of the failure. For example, the fail indicator can include an LED that can be activated to emit light and provide an indication of the failure. A color of the light can correspond to a type, occurrence, or location of the failure on the at least one memory system.