Semiconductor Memory Fuse Management for PPR Yield
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Solution Overview
Problem
Existing semiconductor memory devices face challenges in increasing the number of fuses available for Post-Package Repair (PPR) mode without increasing the total number of fuses, as fuses assigned for non-PPR mode are not utilized efficiently.
Innovation Solution
The semiconductor memory device employs a dual fuse set system, where fuses assigned for non-PPR and PPR modes are dynamically managed, with a program portion that determines available fuses, generates overflow signals, and selectively outputs fuse information to increase the number of available fuses for PPR mode through a rupture operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If fuses are assigned exclusively for non-PPR mode, then the fuse set is simple and easy to manage, but the number of available fuses for PPR mode is limited
Solution Approach 1:
The patent implements multi-functionality by enabling the first fuse set to serve dual purposes: non-PPR mode operations and PPR mode operations. The control logic dynamically selects whether to use the first fuse set or second fuse set based on the operational mode, allowing the first fuse set to be universally utilized across different modes without requiring separate dedicated fuse sets for each mode.
Solution Approach 2:
The patent applies dynamics by introducing dynamic control logic that adapts the fuse set selection based on the operational mode. The control logic changes the usage state of fuse sets from static to dynamic, where the first fuse set can be activated for PPR mode when needed, and the system automatically adjusts which fuse set is available based on current operational requirements.
2Quantity of substance
If the total number of fuses is increased to provide more options for PPR mode, then the number of available fuses for PPR mode increases, but the overall device complexity and fuse management difficulty increase
Solution Approach 1:
The patent segments the fuse sets into distinct first and second fuse sets with specific functional assignments. The first fuse set is primarily for non-PPR mode while the second fuse set is dedicated for PPR mode, creating clear segmentation that simplifies management. This segmentation allows the system to maintain organized fuse allocation without requiring a single large, complex fuse management system.
Solution Approach 2:
The control logic acts as an intermediary between the fuse sets and the operational mode requirements. It mediates the selection process by automatically determining which fuse set should be used based on the operational mode, eliminating the need for manual fuse management and simplifying operation while still providing multiple fuse options for PPR mode.
3Productivity
If fuses for non-PPR mode are not utilized efficiently, then the fuse set structure remains simple, but the production yield and repair capabilities are reduced
Solution Approach 1:
The patent applies the discarding and recovering principle by enabling the recovery of fuse resources through dynamic reuse. The first fuse set, which was previously discarded or underutilized for non-PPR mode operations, is now recovered and reused for PPR mode operations when needed. This recovery mechanism increases production yield and repair capabilities without requiring a completely new fuse set, thus avoiding excessive complexity.
Data Source
AI summary
A semiconductor memory device includes a fuse portion including a first fuse set having a plurality of first fuses assigned for a first mode and a second fuse set having a plurality of second fuses assigned for a second mode, and a program portion suitable for programming an available fuse among the first fuses included in the first fuse set or programming the second fuses included in the second fuse set in response to a repair control signal in the second mode.