Memory Device Temperature-Compensated Interval Oscillator Training
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Solution Overview
Problem
The increasing operating frequency of high-performance memory devices, such as DRAM, makes it challenging to maintain data integrity, as errors in delay time measurements between FIFO and interval oscillator training can change with temperature, affecting the reliability of the memory device.
Innovation Solution
A method is introduced to correct delay times measured during interval oscillator training using temperature information, ensuring the offset between FIFO and interval oscillator training does not exceed a reference value by employing a system on-chip and memory device with interval oscillators and a control logic circuit that adjusts counting values based on temperature ranges.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If interval oscillator training is performed without temperature compensation, then the training speed is fast and simple, but the measurement precision of delay time deteriorates due to temperature-induced offset errors
Solution Approach 1:
The patent applies parameter changes by introducing temperature compensation to adjust the delay time measurements. The system measures temperature and uses it to compensate for temperature-induced variations in delay time, thereby maintaining measurement precision across different operating conditions without sacrificing training speed
Solution Approach 2:
The patent implements feedback by measuring the actual temperature during operation and using this information to correct the delay time measurements from interval oscillator training. This closed-loop approach ensures that the offset between FIFO and interval oscillator training remains within acceptable ranges even as temperature changes
2Speed
If operating frequency is increased to improve performance, then the speed and capacity of memory device improve, but the reliability deteriorates due to increased difficulty in correcting data integrity
Solution Approach 1:
The patent replaces direct mechanical/timing-based delay measurement with a temperature-compensated measurement system. By substituting the raw interval oscillator counting with temperature-adjusted values, the system maintains accurate delay time measurement even at higher operating frequencies where timing margins are tighter
Solution Approach 2:
The patent performs preliminary temperature measurement and compensation calculation before finalizing the delay time training results. This preliminary action ensures that the compensation is applied in advance, allowing the system to maintain reliability at higher speeds without requiring slower, more complex verification processes
Data Source
AI summary
An electronic device includes a system on-chip that outputs a write clock and a write data signal, and a memory device that receives the write data signal based on the write clock and outputs a read data signal and a data strobe signal whose frequency is different from a frequency of the write clock. The memory device further includes a first interval oscillator, a second interval oscillator, and a temperature sensor. The electronic device performs a first training in initialization of the electronic device and performs a second training in an operation after the initialization. The memory device performs a counting operation during an operation of an interval oscillator in the second training and corrects a final count value with reference to temperature information of the memory device.