3D Memory Kerf Staircase Structure for Stress Relief

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Solution Overview

Problem

Semiconductor storage devices with three-dimensional memory cell arrays often experience crystal defects in the substrate between the memory cell array and the peripheral region, known as the kerf region, due to stress differences.

Innovation Solution

The implementation of a semiconductor storage device design that includes a substrate with alternately stacked insulating and conductive layers forming a staircase pattern, along with columnar portions and slits, which helps to alleviate stress by mirroring the configuration of the memory cell array in the kerf region, thereby preventing crystal defects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If a three-dimensional memory cell array is implemented, then storage capacity is improved, but crystal defects appear in the substrate due to stress differences

Engineering Contradiction:
Improvestorage capacityVSAvoidcrystal defect
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The substrate is divided into a memory cell array region and a kerf region, with the staircase pattern selectively applied to the kerf region to segment the stress distribution and prevent crystal defects while maintaining high storage capacity in the memory cell array

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The staircase pattern is applied locally only to the kerf region rather than the entire substrate, creating different structural qualities in different regions: the memory cell array maintains its standard structure for high storage capacity, while the kerf region gets the stress-alleviating staircase pattern to prevent crystal defects

Inventive Principle:
Principle #3Local quality

2Productivity

If the memory cell array is densely packed, then productivity is improved, but stress concentration occurs in the kerf region

Engineering Contradiction:
Improvememory cell densityVSAvoidstress concentration
Core Design Contradiction:
ProductivityVSStress or pressure

Solution Approach 1:

The staircase pattern introduces a vertical dimension to the kerf region structure, creating multiple terraced levels that distribute stress vertically and laterally, thereby reducing stress concentration in the kerf region while allowing the memory cell array to maintain high density

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Data Source

PatentUS11869851B2Semiconductor storage device
Publication Date: 2024.01.09 KIOXIA CORP
  • US11869851B2 patent drawing
  • US11869851B2 patent drawing
  • US11869851B2 patent drawing

AI summary

A semiconductor storage device includes a substrate, a first stacked body provided above the substrate and having a side portion configured in a staircase pattern, a plurality of columnar portions passing through the first stacked body, a second stacked body provided in an outer edge portion of the substrate, and a plurality of first slits. The first stacked body include a plurality of first insulating layers and a plurality of conductive layers that are alternately stacked. The second stacked body includes the plurality of first insulating layers and the plurality of conductive layers that are alternately stacked. The plurality of first slits extends through the first and second stacked bodies in a direction intersecting a stacking direction of the first stacked body.