Memory Metric Filtering for Noise-Resistant Read-Write Decisions

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Solution Overview

Problem

Memory management processes in non-volatile memory devices are susceptible to noise and metric variation, leading to inaccurate decision-making and potential errors in read-write operations due to metric-to-metric variation.

Innovation Solution

Employing a low pass filter to mitigate metric variation in memory management processes, reducing noise and improving the accuracy of read-write reliability assessments by using filtered metrics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If memory management processes use raw metrics to evaluate read-write reliability, then the process can operate with simpler architecture, but the decisions become inaccurate due to noise and metric variation

Engineering Contradiction:
Improveread-write reliability assessment accuracyVSAvoidmemory management process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

A low pass filter is introduced as an intermediary component between the metric collection system and the memory management decisions. The filter processes raw metrics (cell count values) to produce smoothed, noise-reduced metrics that accurately reflect true memory reliability characteristics. This mediator eliminates the direct connection between noisy raw data and decision-making, resolving the contradiction by adding a processing layer that improves accuracy without fundamentally redesigning the entire system.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system changes the parameter characteristics of the metrics through filtering operations. By applying the low pass filter, the metric parameters are transformed from raw, noisy values to smoothed, reliable values. The filter modifies the temporal and statistical properties of the metrics, converting them from unstable measurements to stable indicators that accurately represent memory reliability for decision-making.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If the system collects and processes multiple metrics to reduce noise, then read-write reliability assessment improves, but the time required for evaluation increases

Engineering Contradiction:
Improveread-write operation reliabilityVSAvoidmetric evaluation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The low pass filter operates continuously on incoming metric data, maintaining a running average that smoothly updates as new measurements arrive. This continuous processing eliminates the need for batch evaluations or repeated measurements, allowing the system to achieve reliable metrics in real-time. The filter's continuous action ensures that reliability assessments are always based on the most current, noise-reduced data without requiring additional time for separate validation steps.

Inventive Principle:
Principle #20Continuity of useful action

3Measurement precision

If no filtering is applied to metrics, then the system architecture remains simple and fast, but metric-to-metric variation and noise lead to incorrect memory management decisions

Engineering Contradiction:
Improvemetric accuracyVSAvoidfiltering mechanism complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The low pass filter serves as a simple intermediary that sits between metric collection and decision-making logic. It processes each metric value through a straightforward filtering algorithm, producing cleaned metrics that eliminate noise and variation. This mediator approach improves metric accuracy without requiring complex redesign of the entire memory management architecture, resolving the contradiction by adding minimal complexity only where needed.

Inventive Principle:
Principle #24Intermediary (Mediator)

Data Source

PatentUS20250258624A1Filtering metrics associated with memory
Publication Date: 2025.08.14 MICRON TECHNOLOGY INC
  • US20250258624A1 patent drawing
  • US20250258624A1 patent drawing
  • US20250258624A1 patent drawing

AI summary

In some implementations, a controller of a memory device may obtain a first metric associated with a memory of the memory device using a first memory read configuration. The controller may apply a function to the first metric to obtain a second memory read configuration. The controller may obtain a second metric associated with the memory using the second memory read configuration. The controller may filter the first metric and the second metric to obtain a first filtered metric and a second filtered metric. The controller may provide the first filtered metric and the second filtered metric to a memory management process executing on the controller. The controller may perform an action based on an output of the memory management process, wherein the output is based on the first filtered metric and the second filtered metric.