Memory Module Test Tray With Sensor-Guided Socket Alignment

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Solution Overview

Problem

Existing memory module mounting tests are time-consuming and prone to dislocation or damage during automated insertion, especially when sockets and modules are not properly aligned, leading to failed tests or module damage.

Innovation Solution

A system and method utilizing a test tray with a predetermined pattern of memory modules, a transfer mechanism for precise alignment with a socket, and an angle adjustment sensor to ensure accurate positioning, along with a control system to automate the mounting process, minimizing manual teaching and reducing dislocation risks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If manual or automated hand mounting is used to insert memory modules into sockets, then the mounting test can be conducted, but it takes a considerable amount of time

Engineering Contradiction:
Improvemounting test reliabilityVSAvoidtest time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The system divides the mounting task into multiple parallel operations by providing multiple testers that can simultaneously test multiple memory modules. Each tester independently inserts modules into sockets and performs electrical tests, transforming a sequential process into a parallel one that dramatically reduces total test time while maintaining reliability.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system enables continuous testing operation where multiple memory modules are tested simultaneously across multiple testers without interruption. The automated mechanism ensures uninterrupted insertion and testing cycles, eliminating idle time between operations and maintaining continuous productive action throughout the testing process.

Inventive Principle:
Principle #20Continuity of useful action

2Productivity

If automated mounting is used to increase speed, then mounting time is reduced, but dislocation or damage may occur during the mounting process

Engineering Contradiction:
Improvemounting speedVSAvoidmounting accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The system performs preliminary positioning actions by accurately locating socket positions and orientations before the actual mounting operation. The tester is pre-configured with precise coordinates and angular orientations, ensuring that the automated mounting mechanism inserts modules correctly aligned, preventing dislocation and damage while maintaining high speed.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system incorporates feedback mechanisms that monitor the mounting process in real-time and adjust positioning accordingly. Sensors detect the actual position and orientation of sockets, providing feedback to the control system which then corrects any deviations, ensuring accurate module insertion even during high-speed automated operation.

Inventive Principle:
Principle #23Feedback

3Productivity

If automated mounting is implemented without teaching, then productivity increases, but dislocation or damage occurs when sockets and modules are not properly aligned

Engineering Contradiction:
Improvetesting throughputVSAvoiddislocation and damage
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The system performs preliminary detection and adjustment of socket positions and orientations before automated mounting. By pre-identifying accurate socket locations and calculating required angular orientations, the system eliminates misalignment issues that would cause dislocation or damage, enabling high-speed automated testing without teaching while maintaining reliability.

Inventive Principle:
Principle #10Preliminary action

4Measurement precision

If multiple memory modules are tested sequentially one by one, then individual performance can be evaluated, but the testing process becomes time-consuming

Engineering Contradiction:
Improveindividual module evaluationVSAvoidtotal testing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system segments the testing workload by distributing multiple memory modules across multiple parallel testers. Each tester handles specific modules independently, allowing simultaneous evaluation of multiple modules rather than sequential testing. This segmentation maintains individual module evaluation precision while dramatically reducing total testing time through parallel processing.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system merges multiple testing operations into a single integrated process where multiple testers work simultaneously on different modules. By combining parallel testing operations under a unified system architecture, the system achieves both comprehensive individual evaluation and efficient time utilization, eliminating the trade-off between precision and speed.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables rapid and reliable mounting tests for multiple memory modules, preventing dislocation and damage, thereby improving efficiency and reducing manual intervention.

Implementation Method 1

The angle adjustment sensor may scan an area including the two set areas, measure a distance, and recognize two areas having a critical distance difference from surroundings in the scanned area as the two setting areas

Methodology Applied
Scientific EffectOptical scanning and distance measurement: Time of Flight

Implementation Method 2

An optically recognizable marker may be disposed in the two setting areas, and the angle adjustment sensor may recognize the two setting areas based on light reflected from the marker

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS12436574B2System for memory module mounting test and method therefor
Publication Date: 2025.10.07 ATECO INC
  • US12436574B2 patent drawing
  • US12436574B2 patent drawing
  • US12436574B2 patent drawing

AI summary

A system for a memory module mounting test according to an embodiment of the present disclosure includes: a test tray on which a memory module array in which a plurality of memory modules are positioned in a predetermined pattern is loaded; a tester in which the test tray is able to be seated and a socket corresponding to the predetermined pattern is formed to perform a test on the memory module array; a transfer for transferring the test tray from an initial position to a seating position where the test tray is seated in the tester; and a mounter for mounting the memory module array transferred to the seating position in the socket.