Semiconductor Memory Output Driver Impedance Calibration

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Solution Overview

Problem

As semiconductor memory devices operate at higher speeds, signal swing width decreases, leading to increased external noise and impedance mismatching, which causes data transmission errors and distortion, especially due to process, voltage, and temperature variations.

Innovation Solution

A semiconductor memory device with an output driver that includes an impedance calibration circuit and a PVT sensing control circuit, which actively adjusts impedance to maintain signal integrity by calibrating impedance values and generating control signals to counteract PVT variations, ensuring reliable high-speed data transmission.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If the operating speed of semiconductor memory devices is increased, then the data transmission speed is improved, but the swing width of signals decreases and external noise becomes more significant

Engineering Contradiction:
Improvedata transmission speedVSAvoidexternal noise
Core Design Contradiction:
SpeedVSObject-affected harmful factors

Solution Approach 1:

The output driver dynamically adjusts its output impedance based on detected impedance conditions to maintain optimal signal transmission. The impedance adjustment circuit modifies impedance parameters in real-time to compensate for varying noise conditions and maintain signal integrity at high speeds

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the impedance parameter of the output driver to optimize signal transmission under different operating conditions. By adjusting impedance parameters, the system maintains signal quality despite reduced swing width at higher transmission speeds

Inventive Principle:
Principle #35Parameter changes

2Speed

If the swing width of signal is decreased, then the data transmission speed is improved, but signal reflection due to impedance mismatching increases

Engineering Contradiction:
Improvedata transmission speedVSAvoidsignal transmission reliability
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The impedance detection circuit provides feedback about the impedance conditions to the output driver, which then adjusts its output impedance accordingly. This closed-loop feedback mechanism ensures optimal impedance matching and minimizes signal reflection, maintaining reliable transmission at high speeds

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The output driver transitions from a static impedance design to a dynamic impedance adjustment system that adapts to changing transmission conditions, thereby maintaining signal integrity and reducing reflection effects

Inventive Principle:
Principle #15Dynamics

3Speed

If impedance mismatching occurs at input/output terminals, then the data transmission speed cannot be maintained, but output data may be distorted

Engineering Contradiction:
Improvedata transmission speedVSAvoidoutput data quality
Core Design Contradiction:
SpeedVSManufacturing precision

Solution Approach 1:

The impedance detection and adjustment mechanisms are activated before data transmission to pre-establish optimal impedance conditions. This preliminary action ensures that the transmission path is properly configured before signals are sent, preventing distortion and maintaining speed

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system adjusts impedance parameters to match the transmission medium characteristics, thereby optimizing both transmission speed and signal quality. By changing impedance parameters appropriately, the system prevents data distortion while maintaining high-speed operation

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS8416634B2Semiconductor memory device
Publication Date: 2013.04.09 SK HYNIX INC
  • US8416634B2 patent drawing
  • US8416634B2 patent drawing
  • US8416634B2 patent drawing

AI summary

A semiconductor memory device includes a pad, an impedance calibration circuit configured to provide a first code value corresponding to an impedance value coupled to the pad, a PVT sensing control circuit configured to provide a second code value corresponding to a PVT variation, and an output driver configured to receive data and to pull up or pull down the pad in response to the first code value and second code value.