Memory Panel Test Interface With Virtual Wiring Feedback
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Solution Overview
Problem
Existing memory panel testing processes are prone to wiring errors due to the complexity of the tedious wiring, which is not intuitive and increases the probability of wiring errors, affecting the reliability of the final test results, and the existing systems fail to ensure the reliability of the final test results, and the reliability of the reliability of the reliability of the reliability of the final test results of the ME panels, which is not intuitive and messy, and the test results are not reliable due to the complexity of the wiring process, leading to potential wiring errors, which affects the reliability of the results, and the existing systems fail to ensure the reliability of the results.
Innovation Solution
An intelligent testing system and method for memory panels that includes a power supply unit, reference signal output unit, output detection unit, panel socket, array switches, control unit, communication unit, and display unit, which allows for intuitive virtual node connections and disconnections to ensure accurate and reliable test results.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If manual wiring is used to connect pins for different performance tests, then the testing system can be configured for various tests, but the complexity of wiring increases and the probability of wiring errors increases
Solution Approach 1:
The patent uses a graphical user interface that displays a virtual wiring diagram copying the physical wiring layout. This virtual copy allows operators to configure test connections visually without manually wiring physical pins, eliminating wiring errors while maintaining testing configuration flexibility. The virtual diagram serves as a digital replica that guides and validates the physical connection setup.
2Adaptability or versatility
If manual wiring is used to connect pins for different performance tests, then the testing system can be configured for various tests, but the time required for changing wiring increases
Solution Approach 1:
The system pre-configures test parameters and wiring patterns in the graphical user interface before actual testing begins. Operators can set up multiple test configurations in advance, and the system automatically applies the appropriate wiring pattern when a test is selected, eliminating the need for manual re-wiring during test transitions and significantly reducing wiring change time.
3Ease of manufacture
If manual wiring is used to connect pins, then the testing system can be set up, but the reliability of test results decreases due to wiring errors
Solution Approach 1:
The system incorporates automatic verification that compares actual wiring connections against the configured test parameters. The graphical user interface provides real-time feedback on connection status, and the system automatically detects and alerts operators to any wiring discrepancies, ensuring that only correctly wired configurations proceed to testing and thereby maintaining high test result reliability.
Data Source
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AI summary
The invention relates to an intelligent test system and method for a memory panel. The test system comprises: a power supply unit, a reference signal output unit, an output detection unit, a panel socket, first, second, third and fourth array switch connected to the panel socket, a control unit connected to the array switches, a communication unit connected to the reference signal output unit, the output detection unit and the control unit, and a display unit connected to the communication unit; the display unit displays virtual nodes respectively corresponding to the array switches, the display unit generates or clears connection lines among the virtual nodes when the virtual nodes are triggered, and the control unit triggers the connection nodes corresponding to the array switches to be connected or disconnected when the virtual nodes are triggered; and the display unit controls the reference signal output unit to output a reference signal and obtain a detection signal to obtain a test result of a panel to be tested. The implementation of the present system is convenient to operate, the workload of a memory panel test process can be greatly reduced, and the reliability of memory panel testing is ensured.