Memory Partition Closing Time Based on Reliability Bins
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Solution Overview
Problem
Conventional memory sub-systems inefficiently manage partition closing times based on a one-size-fits-all approach, leading to premature closure of memory blocks and increased program-erase cycles, which reduces the overall efficiency and lifespan of the memory sub-system.
Innovation Solution
Adaptive management of partition closing times based on memory reliability values, such as program-erase cycles and age, to tailor when different portions of memory components are closed, associating them with specific read level threshold bins to optimize data storage and retrieval.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional memory sub-systems use fixed partition closing times, then partition management is simple, but partitions close prematurely and require frequent program-erase cycles
Solution Approach 1:
The patent applies dynamics by transitioning from fixed partition closing times to adaptive closing times that change based on memory reliability values. The partition closing time is dynamically adjusted according to the number of program-erase cycles and age of memory portions, allowing partitions to remain open longer when reliability is high and close sooner when reliability degrades. This dynamic adjustment resolves the contradiction by improving storage efficiency without requiring complex manual intervention.
Solution Approach 2:
The patent changes the parameter of partition closing time based on memory reliability values, which themselves change based on program-erase cycle counts and memory age. By making the closing time parameter variable rather than fixed, the system optimizes data storage efficiency while managing complexity through automated parameter adjustment based on monitored conditions.
2Reliability
If partitions are closed frequently to maintain reliability, then data integrity is preserved, but the lifespan of the memory sub-system is reduced
Solution Approach 1:
The patent implements feedback by continuously monitoring memory reliability values, which are determined by tracking program-erase cycle counts and memory age. This feedback information is used to adjust partition closing times, creating a closed-loop system that maintains data integrity while extending memory lifespan. The feedback mechanism prevents premature closure by adapting to actual reliability conditions rather than using fixed thresholds.
Solution Approach 2:
The dynamic adjustment of partition closing times based on real-time reliability monitoring allows the system to extend partition lifespan when reliability is high and reduce closing frequency. This dynamic approach resolves the contradiction by preserving data integrity through adaptive management rather than aggressive fixed-schedule closure, thereby extending overall memory sub-system lifespan.
3Productivity
If all partitions use the same closing time, then management is uniform and simple, but partitions with higher reliability are closed unnecessarily early
Solution Approach 1:
The patent applies local quality by assigning different closing times to different partitions based on their individual reliability values. Rather than uniform treatment, each partition receives customized closing time parameters according to its specific program-erase cycle count and age. This allows partitions with higher reliability to remain open longer, improving data storage efficiency while maintaining adaptability through automated differentiation.
Solution Approach 2:
The system changes the closing time parameter individually for each partition based on its reliability characteristics. By making parameter changes localized to each partition rather than applying global uniform rules, the system achieves both improved storage efficiency and adaptability. The automated parameter adjustment ensures each partition is optimized for its specific conditions.
Data Source
AI summary
Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to perform adaptive read level threshold voltage operations. The controller determines a memory reliability value associated with an individual portion of the set of memory components and selects a partition closing time for the individual portion of the set of memory components based on the memory reliability value. The controller defines a partition of the individual portion of the set of memory components based on the partition closing time and associates the partition with a bin of a plurality of bins, each of the plurality of bins representing an individual read level threshold voltage against which a charge distribution of data stored in the individual portion of the set of memory components is compared to determine one or more logical values.