Memory Pin Connection Verification via Test Pattern Mapping
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Solution Overview
Problem
The existing methods for determining pin connection relationships between memory devices and electronic devices are cumbersome and unreliable, especially when hardware diagrams are lost or incorrectly drawn, making it difficult to accurately identify correct connections.
Innovation Solution
A wire order testing method and apparatus that uses test patterns to obtain and compare data from memory devices and electronic devices, predicting and determining pin connections based on mapping relationships between test patterns and pins, thereby establishing precise connection relationships.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional hardware diagram methods are used to determine pin connection relationships, then the process requires manual reference to diagrams, but the method becomes unreliable when diagrams are lost or erroneous and extremely difficult to discern correct connections
Solution Approach 1:
The memory device performs self-identification by autonomously responding to test signals with predetermined patterns. The device writes test data to specific memory locations and reads back the data, allowing the testing device to automatically determine pin connections without external hardware diagrams or manual intervention.
Solution Approach 2:
The invention creates a digital mapping copy of the physical pin connections by comparing the test signal patterns sent through connections with the predetermined memory access patterns. This digital representation of connection relationships replaces the need for physical hardware diagrams.
2Measurement precision
If manual debugging with hardware diagrams is used, then the process can determine pin connections, but it is very difficult to discern correct relationships when diagrams are lost or erroneous
Solution Approach 1:
The testing device sends test signals through pin connections and receives feedback responses from the memory device. By analyzing the correspondence between sent test patterns and received response patterns, the system automatically verifies and determines correct pin connections with high precision.
Solution Approach 2:
The invention changes the parameters of test signals (data patterns, memory addresses, read/write operations) to create distinctive signatures for different pin connections. By varying these parameters and observing the responses, the system can precisely identify correct connection relationships.
3Productivity
If hardware diagrams are used for debugging, then pin connections can be identified, but the process becomes cumbersome and time-consuming
Solution Approach 1:
The memory device is pre-configured with predetermined data patterns and address mappings before testing. This preliminary preparation allows the testing device to quickly determine pin connections by simply comparing expected versus actual responses, eliminating the need for time-consuming manual diagram analysis.
Solution Approach 2:
The invention replaces the mechanical process of manually consulting hardware diagrams with an automated electronic testing system. The testing device electronically communicates with the memory device, automatically analyzing connection relationships through programmed test sequences, thereby eliminating manual intervention and significantly reducing debugging time.
Data Source
AI summary
A wire order testing method for testing pin connection relationships between a memory device and an electronic device is provided. The method includes the steps of: testing the memory device with at least one test pattern to obtain at least one first data; predicting at least one second data that is to be obtained from the testing of the memory device with the test pattern according to the mapping relationships between the test pattern and the pins of the memory device; determining the pin connection relationships between the memory device and the electronic device according to the first data and second data.