Memory-in-Pixel Display Defective Memory Rerouting
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Solution Overview
Problem
Memory-in-pixel electronic displays face issues with visual artifacts due to defective memory circuitry, which can render pixels inaccessible, leading to reduced performance and increased design complexity.
Innovation Solution
Implementing rerouting schemes that allow image data to be stored in spare memory components or mapped to least significant bits, enabling continued operation even with defective memory components by rerouting data to functional memory circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If memory components are used to store image data in memory-in-pixel displays, then data storage capability is improved, but defective memory components cause visual artifacts and reduce reliability
Solution Approach 1:
The patent performs preliminary testing of memory components during manufacturing to identify defective components before they are used in the display. A test pattern is written to all memory components, and readout is performed to determine which components are defective. This preliminary action allows the system to prepare correction information in advance, mapping defective memory components to functional ones, thereby preventing visual artifacts and ensuring reliable operation.
2Reliability
If defective memory components are replaced with backup memory components, then reliability is improved, but device complexity increases due to additional routing and mapping requirements
Solution Approach 1:
The patent creates a lookup table during manufacturing that maps defective memory component addresses to functional backup memory component addresses. This preliminary creation of correction information simplifies the runtime operation, as the display controller only needs to reference the lookup table during normal operation, avoiding the need for complex real-time detection and routing decisions.
Solution Approach 2:
The patent uses a lookup table that copies and stores the mapping information between defective and functional memory components. This allows the system to replicate the corrected memory addressing behavior without physically rewriting the memory architecture, thereby reducing the complexity of implementing reliability corrections.
3Reliability
If memory components are tested individually during manufacturing, then reliability is improved, but production time and manufacturing complexity increase
Solution Approach 1:
The patent divides the memory component testing into systematic segments by organizing memory components into rows and columns with corresponding test patterns. This segmentation allows for efficient testing where each memory component is tested in a structured manner, and the results are organized in a lookup table, thereby improving reliability while managing manufacturing time through systematic rather than random testing approaches.
Data Source
AI summary
An electronic display may include a pixel circuit. The pixel circuit may include memory storage to store data values representative of image data to be depicted via the pixel circuit. The memory storage may also include memory components for storing bits of the data value. The pixel circuit may also include a light-emitting device for emitting light based at least in part on the data value and a controller. The controller may receive the data value and store the bits based on a mapping between the bits and the memory components. The mapping may be determined based on routing one or more of the bits associated with one or more defective memory components of the memory components to one or more other memory components of the memory components. The controller may also drive the light-emitting device to emit light based on the bits stored in accordance with the mapping.