Memory Power Supply Voltage Adjustment for Yield
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Solution Overview
Problem
Integrated circuit memories with small device geometries are more susceptible to manufacturing variations, leading to malfunctioning devices and reduced manufacturing yield, increasing costs.
Innovation Solution
The power supply circuitry in integrated circuit memories is configured to detect operating errors in malfunctioning memory cells and adjust the voltage supply to groups of memory cells, including the malfunctioning cell, to correct operational issues without affecting the remaining cells significantly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If small device geometries (e.g., 45 nm) are used to improve component density and reduce power consumption, then component density and power efficiency are improved, but susceptibility to process variation increases causing manufacturing yield to deteriorate
Solution Approach 1:
The patent applies parameter changes by dynamically adjusting the voltage supply to memory cells based on detected operational errors. When a malfunctioning cell is identified, the voltage supply to that cell and potentially adjacent cells is altered to correct the operational defect, thereby compensating for process variations and improving manufacturing yield without changing the physical device geometry
Solution Approach 2:
The patent implements feedback mechanisms by continuously monitoring the operational status of memory cells and using this information to adjust voltage supply parameters. The power supply circuitry detects errors in memory cell operation and responds by modifying voltage levels to correct malfunctions, creating a closed-loop system that adapts to process variations in real-time
2Reliability
If voltage supply is altered to correct malfunctioning memory cells, then operational reliability is improved, but the complexity of power supply circuitry increases
Solution Approach 1:
The patent applies segmentation by dividing the memory array into groups of cells that share common power supply lines. Instead of individually controlling voltage to each cell, the system segments cells into rows, columns, or blocks that can have their voltage supply independently adjusted, thereby reducing the complexity of the power supply circuitry while still enabling targeted correction of malfunctioning cells
Solution Approach 2:
The patent merges the power supply control for multiple memory cells by providing common voltage supply lines to groups of cells. This allows the voltage supply to be adjusted for multiple cells simultaneously through a single control mechanism, reducing the overall complexity of the power supply circuitry compared to individual cell control
Data Source
AI summary
An integrated circuit memory 2 is provided with an array of memory cells 4 and power supply circuitry 10, 12. Detected operating errors in malfunctioning memory cells 14 are identified using a built-in-self-test controller 34. The power supply circuitry 10, 12 is then configured to alter the voltage supply to the malfunctioning memory cells 14 in an attempt to correct their operation. The voltage supply of the row containing the malfunctioning memory cell and the column containing the malfunctioning memory cell may both be altered. The voltage alteration may be an increase or a decrease in voltage supply depending upon the nature of the malfunction detected.