Semiconductor Memory Device Precharging Method for Disturbance Reduction

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Solution Overview

Problem

The reliability of semiconductor memory devices is compromised due to increasing disturbances between memory cells and cell strings as integration levels rise, leading to potential data loss and reduced performance.

Innovation Solution

A program method for semiconductor memory devices that involves precharging cell strings with a positive voltage through a common source line, followed by a program operation on selected memory cells, where bit lines are electrically connected after the positive voltage is blocked, ensuring effective precharging and reduced disturbance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If integration level of semiconductor memory device is increased to reduce interval between memory cells and cell strings, then device density is improved, but disturbance between memory cells and cell strings increases

Engineering Contradiction:
Improvedevice densityVSAvoiddisturbance between memory cells
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent applies preliminary action by precharging cell strings to a first voltage level before the program operation. This preliminary voltage application ensures that memory cells start from a known state, reducing disturbances during the programming process and improving overall reliability while maintaining high device density

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent changes voltage parameters dynamically during operation. Cell strings are precharged to a first voltage, then during program operation, word lines are raised to a second voltage higher than the first. This parameter change allows the system to maintain stability at high integration levels by using voltage thresholds to control cell states and reduce interference between adjacent cells

Inventive Principle:
Principle #35Parameter changes

2Reliability

If precharge operation is performed before program operation, then reliability is improved, but operation time is increased

Engineering Contradiction:
Improvedata integrityVSAvoidoperation time
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The precharge operation is performed as a preliminary action before program operation, applying voltage to cell strings in advance. This ensures data integrity by establishing stable initial conditions, though it does add some time overhead that is managed through efficient timing control

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent maintains continuity of useful action by overlapping certain operations and using the precharged state directly in the subsequent program operation without unnecessary intermediate steps. The word line voltage is raised continuously from the first to second level, and bit line voltage is adjusted in a coordinated manner, minimizing idle time while ensuring reliability

Inventive Principle:
Principle #20Continuity of useful action

Data Source

PatentUS9042176B2Semiconductor memory device, system having the same and program method thereof
Publication Date: 2015.05.26 SK HYNIX INC
  • US9042176B2 patent drawing
  • US9042176B2 patent drawing
  • US9042176B2 patent drawing

AI summary

The present invention relates to a semiconductor memory device and a program method thereof. The program method according to an embodiment of the present invention includes: precharging a plurality of cell strings by providing a positive voltage to the plurality of cell strings through a common source line; and performing a program operation on selected memory cells by applying a program pulse to the selected memory cells.