Memory Pre-Fetch Circuit for High-Speed Testing via Low-Frequency Channels

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Solution Overview

Problem

The limited number of high-frequency channels in test equipment for semiconductor memory apparatuses restricts the efficiency of high-speed data processing tests, as most high-speed tests require high-frequency channels, which are fewer in number than low-frequency channels.

Innovation Solution

A pre-fetch circuit for semiconductor memory apparatuses that can perform high-frequency operating tests through low-frequency channels by using a pre-fetch unit, registers, and a control unit to selectively activate data strobe signals, allowing data to be latched in order or out of order based on test mode signals, effectively converting low-frequency data into high-frequency data patterns.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If high-frequency channels are used for high-speed data processing tests, then test speed and data processing efficiency are improved, but the number of apparatuses that can be tested simultaneously is limited due to the small number of high-frequency channels

Engineering Contradiction:

Improvetest efficiencyVSAvoidnumber of testable apparatuses

Core Design Contradiction:

ProductivityVSAdaptability or versatility

Solution Approach 1:

The patent changes the frequency parameter of data transmission by using a pre-fetch circuit that converts low-frequency channel data into high-frequency data patterns. The pre-fetch unit stores incoming low-frequency data and outputs it at high frequency, effectively transforming the frequency characteristic to enable high-speed testing through limited high-frequency channels

Inventive Principle:

Principle #35Parameter changes

Solution Approach 2:

The pre-fetch circuit acts as an intermediary between the low-frequency channel and the high-speed test equipment. It receives data from low-frequency channels, processes and buffers it, then outputs at high frequency to the test equipment, mediating the frequency mismatch and enabling efficient use of limited high-frequency channels

Inventive Principle:

Principle #24Intermediary (Mediator)

2Adaptability or versatility

If the number of high-frequency channels is increased to test more apparatuses simultaneously, then the number of testable apparatuses is improved, but the cost and complexity of test equipment increases

Engineering Contradiction:

Improvenumber of testable apparatusesVSAvoidtest equipment complexity

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The pre-fetch circuit enables low-frequency channels to perform the function of high-frequency channels by transforming data frequency. This multi-functionality allows the same physical channel to serve both low-frequency and high-frequency testing needs, increasing the number of testable apparatuses without adding more high-frequency channels or increasing equipment complexity

Inventive Principle:

Principle #6Universality (Multi-functionality)

Data Source

PatentUS7814247B2Pre-fetch circuit of semiconductor memory apparatus and control method of the same

Publication Date: 2010.10.12 SK HYNIX INC

AI summary

A pre-fetch circuit of a semiconductor memory apparatus can carry out a high-frequency operating test through a low-frequency channel of a test equipment. The pre-fetch circuit of a semiconductor memory apparatus can includes: a pre-fetch unit for pre-fetching data bits in a first predetermined number; a plurality of registers provided in the first predetermined number, each of which latches a data in order or a data out of order of the pre-fetched data in response to different control signals; and a control unit for selectively activating the different control signals in response to a test mode signal, whereby some of the registers latch the data out of order.