Memory Programming Control for Elapsed-Time Reliability

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Solution Overview

Problem

As the number of bits of data stored in memory cells increases, the interval between threshold voltages narrows, leading to reduced reliability in memory devices.

Innovation Solution

A memory device and method that includes a control circuit to check the elapsed time between program operations and switch between normal and dummy program operations based on elapsed time intervals, ensuring reliable data storage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the number of bits of data stored in memory cells increases, then storage capacity is improved, but the interval between threshold voltages becomes narrow and reliability is reduced

Engineering Contradiction:
Improvestorage capacityVSAvoidreliability
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent applies dynamics by making the program operation type variable rather than fixed. The control circuit dynamically switches between normal program operations and dummy program operations based on the elapsed time since the previous program operation. This dynamic adjustment allows the system to adapt to different time intervals, thereby maintaining reliable threshold voltage intervals even when storing multiple bits per cell

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the parameter of program operation type (normal vs. dummy) based on the elapsed time parameter. When the elapsed time exceeds a reference threshold, the system transitions from normal program operations to dummy program operations. This parameter change mechanism compensates for the narrowed threshold voltage intervals caused by multi-bit storage, thereby maintaining reliability while achieving high storage capacity

Inventive Principle:
Principle #35Parameter changes

2Productivity

If normal program operations are performed continuously without considering elapsed time, then productivity is improved, but reliability deteriorates when elapsed time is long

Engineering Contradiction:
ImproveproductivityVSAvoidreliability
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements feedback by having the control circuit monitor the elapsed time between program operations and use this information to determine the next program operation type. This feedback loop ensures that when sufficient time has passed since the previous operation, the system switches to dummy program operations to maintain reliability, while allowing continuous normal operations when time intervals are appropriate

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system dynamically adjusts the program operation schedule based on real-time elapsed time measurements. Rather than following a fixed program sequence, the system adapts its operation type (normal or dummy) based on the actual time elapsed since the previous program operation, thereby balancing productivity and reliability

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS12542176B2Memory device and method of operating the same
Publication Date: 2026.02.03 SK HYNIX INC
  • US12542176B2 patent drawing
  • US12542176B2 patent drawing
  • US12542176B2 patent drawing

AI summary

A memory device, and a method of operating the same, includes checking a first elapsed time between an end time of a program operation performed on a first page and a selection time when a second page is selected after the end time, comparing the first elapsed time with a reference time interval, and performing a dummy program operation on the second page when the first elapsed time is equal to or longer than the reference time interval.