Memory Cell Read Boost Timing for First and Second Read Margins
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Solution Overview
Problem
Non-volatile memory devices face challenges in efficiently determining the read condition of memory cells, leading to increased read time and potential read disturb due to the difference in boost timing requirements between first and second read conditions.
Innovation Solution
A control circuit is configured to determine the read condition of a memory cell, allowing for dynamic adjustment of boost timing based on the read condition, thereby optimizing the read operation and reducing total read time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If a fixed boost timing is used for all read conditions, then the control circuit is simple, but read time increases and read disturb occurs
Solution Approach 1:
The patent applies dynamics by making the boost timing adjustable rather than fixed. The control circuit dynamically selects between a first boost timing for first read conditions and a second boost timing for second read conditions, allowing the system to adapt to different operational states and reduce read time when appropriate.
Solution Approach 2:
The patent changes the parameter of boost timing based on read conditions. By determining whether a first or second read condition exists and selecting the corresponding boost timing, the system optimizes read performance for different scenarios without requiring complete redesign of the control circuit.
2Productivity
If different boost timings are applied for different read conditions, then read time is reduced, but the control circuit becomes more complex
Solution Approach 1:
The control circuit dynamically adapts its behavior based on detected read conditions. It selects appropriate boost timings (first or second) depending on whether first or second read conditions are present, thereby optimizing productivity without requiring complex hardware redesign.
Solution Approach 2:
The system changes operational parameters (boost timing) based on detected conditions. By implementing parameter changes rather than structural complexity, the patent achieves improved productivity while keeping the control circuit relatively simple.
3Reliability
If boost timing is extended to cover all read conditions, then read disturb is minimized, but total read time increases
Solution Approach 1:
The patent applies local quality by providing different boost timings for different read conditions. Instead of using a single extended boost timing for all conditions, it uses a first boost timing for first read conditions and a second boost timing for second read conditions, optimizing both reliability and time efficiency locally for each scenario.
Solution Approach 2:
The system dynamically adjusts boost timing based on actual read conditions. This dynamic approach allows the control circuit to maintain reliability when needed while reducing unnecessary time delays, achieving an optimal balance between reliability and speed.
Data Source
AI summary
An apparatus that comprises a plurality of memory cells and a control circuit coupled to the plurality of memory cells is disclosed. The control circuit is configured to perform a read operation. The read operation includes determining a read condition of a memory cell, where the read condition is of a plurality of read conditions and determining a boost timing for the memory cell, where the boost timing corresponds to the read condition.