Memory Controller Read Disturb Thresholds Tuned by Temperature
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Solution Overview
Problem
Current memory systems perform read disturb scan operations based on predetermined read count thresholds, leading to unnecessary memory management operations and inefficiencies due to die-by-die reliability variation and temperature dependence, resulting in poor performance and resource wastage.
Innovation Solution
A memory controller dynamically adjusts read disturb scan operations based on temperature and program erase cycle count values, selecting individual read disturb condition criteria for each memory component to optimize media management operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If read disturb operations are performed frequently to ensure data integrity, then reliability is improved, but productivity deteriorates due to increased operational overhead and time consumption
Solution Approach 1:
The patent dynamically adjusts the read disturb threshold parameter based on temperature conditions. At elevated temperatures, the threshold is lowered to trigger read disturb operations more frequently, ensuring data integrity when thermal effects are more pronounced. At lower temperatures, the threshold is raised to reduce unnecessary operations, thereby improving productivity while maintaining reliability when it is less critical.
2Productivity
If read disturb operations are performed less frequently to improve productivity, then operational efficiency is improved, but reliability deteriorates as data integrity may be compromised
Solution Approach 1:
The system modifies the read disturb threshold parameter dynamically based on temperature. During high-temperature periods when data integrity is more vulnerable, the threshold is adjusted to ensure operations occur frequently enough to maintain reliability. During low-temperature periods, the threshold allows for reduced operation frequency, improving productivity without compromising reliability.
Solution Approach 2:
The patent implements a feedback mechanism that continuously monitors temperature conditions and adjusts the read disturb threshold accordingly. This closed-loop control ensures that reliability is maintained by triggering operations when temperature and read count indicate potential data integrity issues, while allowing productivity to improve by suppressing unnecessary operations under benign conditions.
3Adaptability or versatility
If temperature-based dynamic threshold adjustment is implemented to optimize both reliability and productivity, then adaptability is improved, but device complexity increases due to additional monitoring and decision logic
Solution Approach 1:
The patent implements temperature-based parameter adjustment by modifying the read disturb threshold according to monitored temperature conditions. This approach improves adaptability by optimizing operations for different thermal environments while maintaining relatively simple implementation through straightforward threshold comparisons and conditional logic, thus limiting the increase in device complexity.
Data Source
AI summary
Aspects of the present disclosure configure a system component, such as a memory sub-system controller, to provide adaptive media management based on temperature-related memory component capabilities. The controller determines a read disturb condition criterion associated with an individual memory component of a set of memory components and determines a temperature of a memory sub-system comprising the set of memory components. The controller adjusts the read disturb condition criterion based on the temperature and program erase cycles (PEC) of the memory sub-system and performs an individual media management operation on the individual memory component in response to determining that the adjusted read disturb condition criterion has been satisfied.