Memory Corrective Read Trim Selection for Lower Latency
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Solution Overview
Problem
Memory systems face increased latency, power consumption, and processing load when performing corrective read operations due to the need to iterate through a large set of trim settings to accommodate wide ranges of operating conditions, such as varying temperatures and data retention durations.
Innovation Solution
A memory system configures to select a subset of trim settings based on data retention conditions and temperature conditions to perform corrective read operations, balancing read margin reliability and latency, and if initial attempts fail, it proceeds with other error handling operations without further corrective reads.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the memory system iterates through a large set of trim settings to accommodate wide ranges of operating conditions, then read margin reliability is improved, but latency and power consumption increase
Solution Approach 1:
The patent applies parameter changes by selecting different subsets of trim settings based on detected operating conditions (temperature, data retention duration). The system dynamically adjusts which trim settings to iterate through, reducing the search space when conditions indicate stable data retention, thereby lowering latency while maintaining reliability when needed
Solution Approach 2:
The system dynamically adapts its behavior by monitoring operating conditions and adjusting the corrective read process accordingly. When data retention conditions indicate potential data loss, the system activates comprehensive trim setting iteration; when conditions are stable, it uses reduced sets, making the process dynamic rather than static
2Reliability
If the memory system iterates through a large set of trim settings to accommodate wide ranges of operating conditions, then read margin reliability is improved, but power consumption increases
Solution Approach 1:
The patent changes the parameter of trim setting selection based on operating conditions. By detecting temperature and data retention duration, the system selects appropriate trim setting subsets that balance reliability needs with power consumption, avoiding unnecessary iterations when conditions indicate stable data retention
Solution Approach 2:
The system applies partial action by performing only the necessary degree of trim setting iteration required for the current operating conditions. Rather than always iterating through all possible trim settings, it uses partial sets when conditions allow, reducing power consumption while maintaining sufficient reliability
3Adaptability or versatility
If the memory system iterates through a large set of trim settings to accommodate wide ranges of operating conditions, then adaptability is improved, but processing load increases
Solution Approach 1:
The system changes its processing approach based on detected parameters (temperature, data retention duration). By selecting appropriate trim setting subsets corresponding to current operating conditions, it maintains adaptability to diverse conditions while reducing processing load through targeted rather than exhaustive search
Solution Approach 2:
The corrective read process becomes dynamic, adapting its complexity based on real-time monitoring of operating conditions. The system automatically adjusts processing load by selecting appropriate trim setting subsets, ensuring high adaptability when needed while reducing processing burden during stable operations
Data Source
AI summary
Methods, systems, and devices for a corrective read of a memory device with reduced latency are described. A memory system may identify a read error based on accessing a memory device, and may select a trim setting for a performing a corrective read operation based on a data retention condition associated with the accessed memory device. Such a data retention condition may be associated with a data retention duration, or a cross-temperature condition, among other criteria or combinations thereof. In some implementations, the memory system may select from a subset of possible trim settings, which may be associated with relevant process corners. For example, the memory system may select between a first trim setting that is associated with a relatively large cross-temperature and a relatively short data retention duration and a second trim setting that is associated with a relatively small cross-temperature and a relatively long data retention duration.