Memory Device Redundant Data Storage for Reliability

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Solution Overview

Problem

Memory devices face challenges in maintaining data reliability when storing multiple bits in a single cell, as this can reduce the reliability of the stored data compared to storing a single bit, necessitating a balance between data reliability and storage capacity.

Innovation Solution

The memory device operates in a mode that prioritizes data reliability by generating redundant data and storing it alongside the original data, using a subset of reference thresholds for read operations and additional thresholds to correct errors, thereby increasing the reliability of the stored data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If multiple bits are stored in a single memory cell to increase storage capacity, then storage capacity is improved, but data reliability deteriorates

Engineering Contradiction:
Improvestorage capacityVSAvoiddata reliability
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The patent segments the storage function by dividing data into original data and redundant data, storing them in separate memory cells. This segmentation allows the system to maintain high storage capacity while ensuring data reliability through the redundant copy stored in dedicated reliability-focused cells.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent changes the operational parameters of different memory cell groups: first group cells operate with parameters optimized for capacity (storing multiple bits), while second group cells operate with parameters optimized for reliability (storing single bits with enhanced error correction). This parameter differentiation resolves the contradiction between capacity and reliability.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If redundant data is generated and stored alongside original data to improve reliability, then data reliability is improved, but device complexity increases

Engineering Contradiction:
Improvedata reliabilityVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements a copying mechanism where redundant data is generated as a copy of the original data and stored in separate memory cells. This copying approach provides robust error correction capabilities while maintaining relatively simple device architecture, as the redundant copy can be used to recover from errors without requiring complex real-time correction mechanisms.

Inventive Principle:
Principle #26Copying

Solution Approach 2:

The redundant data storage mechanism serves multiple functions: it provides error detection, error correction, and data validation. This multi-functionality reduces the need for separate complex systems for each function, thereby limiting the increase in device complexity while achieving high reliability.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Speed

If a subset of reference thresholds is used for read operations to improve speed, then read speed is improved, but measurement precision deteriorates

Engineering Contradiction:
Improveread speedVSAvoidread precision
Core Design Contradiction:
SpeedVSMeasurement precision

Solution Approach 1:

The patent applies partial action by using only a subset of reference thresholds for reading data from the first group of memory cells (capacity-optimized cells). This partial approach achieves faster read speeds by reducing the number of threshold comparisons needed, while the second group of reliability-optimized cells uses full threshold sets when needed, balancing speed and precision requirements.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS11966600B2Memory device with enhanced data reliability capabilities
Publication Date: 2024.04.23 MICRON TECHNOLOGY INC
  • US11966600B2 patent drawing
  • US11966600B2 patent drawing
  • US11966600B2 patent drawing

AI summary

Methods, systems, and devices for memory device with enhanced data reliability capabilities are described. For a write operation, a memory device may receive a write command from a host device indicating a first set of data. The memory device may determine to operate in first mode of operation associated with a reliability above a threshold and generate a second set of data to store with the first set of data based on operating in the first mode of operation. For a read operation, the memory device may identify that a read command received from a host device is associated with the first mode of operation. Based on operating in the first mode of operation, the memory device may select one or more reference thresholds (e.g., a subset of reference thresholds) to retrieve the first set of data and transmit the first set of data to the host device.