Memory Remapping Observation Logic for Defect Tracking
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current integrated circuit (IC) memory devices lack a mechanism for users to determine if a defect has been detected and repaired, and to observe the configuration of the memory array after a repair, especially with intermittent defects and the absence of permanent configuration information.
Innovation Solution
Incorporating remapping observation logic that allows users to output and observe remapping bits, using a multiplexer to select between data and remap bits, and displaying this information on a computer monitor to indicate remapped locations, thereby enabling users to determine repair status and configuration.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If hard repair procedure is used to remap defective memory portions, then the memory device can be permanently repaired, but there is no mechanism for users to determine the repair status or configuration
Solution Approach 1:
The patent implements feedback by providing users with the ability to query the remapping status through observation logic that outputs remapping information. This allows users to receive feedback about whether remapping has occurred and which memory locations have been remapped, resolving the information loss problem while maintaining the reliability of hard repair procedures.
2Adaptability or versatility
If soft repair procedure is used with intermittent defects, then the memory device can adapt to defects, but the hardware configuration may change over time making it difficult to track repair status
Solution Approach 1:
The observation logic provides continuous feedback about the current hardware configuration and remapping status. This allows users to track changes over time and understand the current state of the memory device, addressing the information loss problem while maintaining the adaptability of soft repair procedures for intermittent defects.
3Reliability
If remapping logic is added to enable defect repair, then the memory device can repair defects, but additional circuitry is required which increases device complexity
Solution Approach 1:
The observation logic is designed to serve multiple functions: it can output remapping information on demand, work with both hard and soft repair procedures, and provide configuration tracking without requiring separate dedicated circuitry for each function. This multi-functionality reduces the overall complexity increase while maintaining reliable defect repair capability.
Data Source
AI summary
The invention provides a method and an apparatus for enabling a user to determine whether a defective location in a memory device of an integrated circuit (IC) has been remapped to a location in a redundant memory portion of the memory device. Users are provided with the ability to observe the remapping, and preferably, to determine which locations in the memory device have been remapped. The memory device includes remapping observation logic that causes bits associated with remapping to be output from the memory device. Preferably, a computer receives the remapping bits and displays a description of any remapping on a display monitor. Therefore, not only is a user able to determine whether remapping has occurred, but also which locations in the memory device have been remapped.