Memory Repair Fuse Allocation for Defect-Based Segment Addressing

The patent makes fuse latch sets and fuse arrays universal by decoupling them from specific redundant rows or columns. Instead of having dedicated fuse latches for each redundant element, the system uses a shared pool of fuse latches that can be dynamically allocated to any defective region through the segment-address determination circuit. This allows the same fuse latch set to serve multiple redundant rows or columns depending on where defects occur, dramatically reducing the total number of fuse elements needed while maintaining full repair capability.

The patent introduces dynamic allocation of repair resources through the segment-address determination circuit. Rather than static hard-wired connections between fuse latches and redundant elements, the system dynamically determines which fuse latch set to use based on the actual defect location. The segment address generated by the determination circuit enables flexible, adaptive routing of repair signals to the appropriate redundant rows or columns, allowing the repair mechanism to respond optimally to any defect pattern without requiring a fixed infrastructure for each possible defect scenario.

The patent creates a universal repair infrastructure where fuse latch sets and fuse arrays serve multiple purposes and multiple redundant elements simultaneously. Instead of having dedicated repair elements for each redundant row or column (most of which remain unused), the system uses a shared pool of repair resources that are allocated dynamically based on actual defect locations. The segment-address determination circuit enables this universal usage by generating addresses that route repair operations to the appropriate redundant elements regardless of which region is defective, ensuring that every fuse element can be utilized for any repair need.

The patent enables the repair system to self-allocate resources efficiently through the segment-address determination circuit. When a defect is detected, the circuit automatically determines the appropriate segment address and activates the corresponding fuse latch set from the shared pool, without requiring pre-configuration or manual allocation. This self-service mechanism ensures that repair elements are used only when and where needed, eliminating waste from pre-provisioned but unused repair infrastructure while maintaining full repair capability across all possible defect scenarios.

The patent achieves complete repair coverage with minimal footprint by making fuse latch sets and fuse arrays universal and shareable. Instead of provisioning dedicated repair elements for every possible redundant row or column (which would require excessive area), the system uses a compact shared pool of fuse latches that can service any defective region. The segment-address determination circuit enables this compact design by dynamically routing repair operations to the appropriate redundant elements based on actual defect locations, ensuring full coverage is achieved with a fraction of the elements that would be needed in a hard-wired, dedicated approach.

The patent achieves comprehensive repair coverage with small footprint through dynamic resource allocation. The segment-address determination circuit dynamically generates addresses that route repair operations to any redundant row or column as needed, allowing a small pool of fuse latch sets to effectively cover the entire memory array. This dynamic approach replaces the need for static, area-intensive hard-wired connections to every possible repair target, enabling complete coverage with minimal footprint by activating only the necessary repair elements for each specific defect scenario.