Memory Repair Registers Boot-Up Initialization
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Solution Overview
Problem
As semiconductor memory devices increase in capacity, it becomes increasingly difficult to fabricate memory devices without defective memory cells, necessitating a method for efficient resource use in memory repair and configuration.
Innovation Solution
Incorporating a memory system with a nonvolatile memory circuit, repair register sets, setting register sets, and a repair circuit that utilize flag information to efficiently manage and replace defective memory cells with redundant ones during boot-up operations, allowing for flexible resource allocation between setting and repair operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Quantity of substance
If memory capacity is increased, then storage capability is improved, but the likelihood of defective memory cells increases
Solution Approach 1:
The patent segments the memory device into functional groups by introducing repair register sets that can independently manage repair operations for different memory regions. Each repair register set contains repair information for specific defective cells, allowing localized repair without affecting the entire memory array. This segmentation enables high-capacity memory to maintain reliability by isolating and repairing defects in discrete units.
Solution Approach 2:
The patent implements preliminary action by pre-loading repair information and replacement data into repair register sets during manufacturing or initialization before the memory device is put into service. The nonvolatile memory circuit stores multiple data sets including repair information that is transferred to repair register sets during boot-up operations, so that repair operations are already prepared and can be executed immediately when defects are detected, ensuring continuous operation without data loss.
2Reliability
If redundant memory cells are added for repair, then reliability is improved, but device complexity increases
Solution Approach 1:
The patent applies universality by designing repair register sets that can serve multiple functions: storing repair information for defective cells, holding replacement data from redundant cells, and managing boot-up operations. The same repair register sets handle both repair operations and configuration tasks, eliminating the need for separate dedicated circuits for each function and reducing overall device complexity while maintaining comprehensive repair capability.
Solution Approach 2:
The patent merges the nonvolatile memory circuit that stores data sets with the repair functionality by integrating repair information storage and repair register sets into a unified structure. The repair register sets are combined with the memory array and control logic, allowing repair operations to be performed using existing memory infrastructure rather than requiring completely separate repair circuits, thus reducing complexity while improving reliability.
3Reliability
If repair operations are performed during boot-up, then reliability is improved, but operation time increases
Solution Approach 1:
The patent performs preliminary action by pre-transferring repair information from nonvolatile memory to repair register sets during the boot-up process before the memory array is fully initialized. This ensures that repair operations are prepared in advance and can be executed efficiently without delaying subsequent memory operations. The repair information is read and loaded during boot-up, so that when repair operations are needed, they can be performed immediately using the pre-loaded data in the repair register sets.
Solution Approach 2:
The patent maintains continuity of useful action by overlapping the repair information transfer operation with the boot-up process. While the memory device is initializing, the repair register sets are being populated with repair information from nonvolatile memory, so that repair preparation occurs concurrently with normal initialization activities rather than sequentially. This allows repair operations to be ready when needed without adding significant delay to the overall boot-up time.
Data Source
AI summary
A memory includes: a memory array; a nonvolatile memory circuit suitable for storing a plurality of data sets each including flag information and multi-bit data; a plurality of repair register sets suitable for receiving and storing the multi-bit data included in the data sets whose flag information is marked for repair among the data sets during a boot-up operation; a plurality of setting register sets suitable for storing setting information included in the data sets whose flag information is marked for setting among the data sets during the boot-up operation; and a repair circuit suitable for repairing a defect in the memory array based on the multi-bit data stored in the repair register sets.