Semiconductor Memory Repair Select Information Generation
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Solution Overview
Problem
Existing semiconductor devices face challenges in efficiently performing repair operations and correcting errors without comparing inputted and fail addresses, which slows down the repair process and complicates error correction in memory circuits.
Innovation Solution
The implementation of a semiconductor device with a repair select information generation unit that stores column addresses and generates repair select information to electrically connect columns with redundancy columns, allowing for error correction and repair operations without the need for address comparison, using a configuration that includes data transfer lines, columns, redundancy columns, and error correction units.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If address comparison is performed during repair operations, then error correction can be achieved, but the repair speed is reduced and the process becomes more complex
Solution Approach 1:
The patent pre-generates repair select information during manufacturing based on detected defective columns. This information is stored in a repair select information generation unit, so that during repair operations, the pre-computed selection signals are directly used without requiring address comparison, thus eliminating the speed penalty while maintaining error correction capability
Solution Approach 2:
The patent extracts the address comparison function from the repair operation process by separately pre-computing and storing repair select information. This separates the error correction logic from the address matching logic, allowing repair operations to proceed using pre-prepared selection signals without performing address comparison during runtime
2Reliability
If address comparison is performed during repair operations, then defective columns can be identified, but the operational complexity increases
Solution Approach 1:
The patent extracts the complex address comparison and identification logic from the repair operation pathway by performing it during manufacturing. The repair select information generation unit pre-identifies defective columns and generates corresponding selection signals, which are then stored for direct use during repair operations, simplifying the runtime complexity
Solution Approach 2:
The patent performs column identification and repair signal generation as preliminary actions during manufacturing. The repair select information is pre-computed and stored, so that during actual repair operations, the system only needs to retrieve and apply the pre-prepared selection information without performing complex identification algorithms
Data Source
AI summary
An electronic device comprising a semiconductor memory unit that may include a plurality of data transfer lines; a plurality of columns including a plurality of memory cells; at least one redundancy column including a plurality of redundancy memory cells and configured to replace at least one column among the plurality of columns; a repair select information generation unit configured to store a column address of the at least one column to be replaced among the plurality of columns and generate a plurality of repair select information in response to the stored column address; and a plurality of repair selection units connected with data transfer lines corresponding to them among the plurality of data transfer lines, columns corresponding to them among the plurality of columns and the at least one redundancy column, and each configured to electrically connect a column selected among a column corresponding to it and the at least one redundancy column, to a data transfer line corresponding to it, in response to repair select information corresponding to it among the plurality of repair select information.