Memory Sub-System Burst Scans for Low-Power Data Retention

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Solution Overview

Problem

Memory devices in low power modes face challenges in completing media scans within the required time frame due to reduced power availability, leading to potential data retention issues and non-compliance with reliability requirements, especially in automotive applications where they spend a significant portion of their lifetime in low power modes.

Innovation Solution

Implementing a burst scan mechanism initiated by the memory sub-system, which scans multiple pages during each wake-up cycle in low power mode, adjusting scanning parameters to meet device qualification criteria while minimizing power consumption spikes.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Use of energy by moving object

If the memory device operates in low power mode to reduce energy consumption, then energy efficiency is improved, but the time required to complete media scans increases and reliability deteriorates

Engineering Contradiction:
Improvepower consumptionVSAvoiddata retention reliability
Core Design Contradiction:
Use of energy by moving objectVSReliability

Solution Approach 1:

The patent implements dynamic scan operations that adapt to power mode conditions. The memory device transitions between different scan modes (normal scan in active mode, burst scan in low power mode) based on real-time power state detection, allowing the system to maintain reliability across varying power conditions while optimizing energy consumption.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent employs periodic burst scan operations during low power mode wake-up cycles. Instead of continuous scanning, the device performs intensive scan bursts at specific intervals when power is available, then returns to low power state. This periodic approach ensures data integrity is maintained while minimizing the time spent in high-power states.

Inventive Principle:
Principle #19Periodic action

2Reliability

If the memory device performs media scans at regular intervals to ensure data integrity, then reliability is improved, but power consumption increases during low power mode

Engineering Contradiction:
Improvedata integrityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent performs media scans in advance during active mode before transitioning to low power mode. By completing scan operations while full power is available, the system ensures data integrity is verified before entering energy-saving state, eliminating the need for frequent scans during low power mode and thus reducing overall power consumption.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent implements burst scan operations that rapidly scan multiple pages in succession during brief wake-up periods from low power mode. This rushing through of scan operations allows the device to complete necessary integrity checks in compressed time frames, minimizing the duration of high-power states while maintaining reliability.

Inventive Principle:
Principle #21Skipping (Rushing through)

3Reliability

If the memory device completes full media scans within the required time frame, then reliability is improved, but the complexity of managing scan operations increases

Engineering Contradiction:
Improvedevice qualification complianceVSAvoidscan management complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements self-managed scan operations where the memory device autonomously determines when to perform scans based on its own power state transitions. The device monitors its own wake-up cycles from low power mode and automatically initiates appropriate scan operations without external intervention, simplifying the overall management complexity while ensuring compliance with reliability requirements.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent dynamically changes scan parameters (scan depth, scan frequency, pages per burst) based on the detected power mode and wake-up cycle characteristics. By adjusting these parameters in real-time, the system achieves reliable data integrity verification without requiring complex fixed-schedule scan management, as the parameters automatically adapt to current operational conditions.

Inventive Principle:
Principle #35Parameter changes

4Productivity

If the memory device scans multiple pages during each wake-up cycle in low power mode, then productivity is improved, but power consumption spikes increase

Engineering Contradiction:
Improvescan completion rateVSAvoidpower consumption spike
Core Design Contradiction:
ProductivityVSPower

Solution Approach 1:

The patent implements partial burst scan operations where the device scans a selected subset of pages during each wake-up cycle rather than scanning all pages. This partial action approach maintains productivity by progressively scanning through the memory space over multiple wake-up cycles, while limiting the number of pages scanned per cycle to control power consumption spikes within acceptable thresholds.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS12493416B1Memory sub-system initiated burst scan under low power mode
Publication Date: 2025.12.09 MICRON TECHNOLOGY INC
  • US12493416B1 patent drawing
  • US12493416B1 patent drawing
  • US12493416B1 patent drawing

AI summary

A wake up cadence at which the memory device is to wake up during a low power mode is determined. Based on the wake up cadence, a processing device determines a finite number of pages of the memory device to be scanned per wake up during the low power mode to satisfy a criterion for memory device qualification, the criterion being associated with the memory device's data retention capability. Upon detecting the low power mode, a burst scan operation is performed to scan the finite number of pages in the memory device each time the memory device wakes up at the determined cadence.