Nonvolatile Memory Retention Unit Electron Traps

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Nonvolatile memory devices face issues with data retention due to conduction paths becoming short or changing resistance states even when no voltage is applied, leading to degraded data retention properties.

Innovation Solution

Incorporating a retention unit with electron traps between the electrodes, which traps electrons and prevents ionization of the metal conduction path, thereby maintaining a prescribed resistance state for a long time.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a conduction path is formed by metal ion diffusion in the resistance change unit, then low resistance state is achieved, but the conduction path becomes unstable and changes resistance state even without applied voltage

Engineering Contradiction:
Improvedata retention propertiesVSAvoidresistance state stability
Core Design Contradiction:
ReliabilityVSStability of the object's composition

Solution Approach 1:

A retention unit is introduced as an intermediary component between the ion supply unit and the resistance change unit. This retention unit contains trapped electrons that act as a mediator to prevent metal ion diffusion, thereby stabilizing the resistance state without requiring continuous voltage application. The retention unit serves as a buffer that controls the interaction between ions and the resistance change unit.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

Electrons are preliminarily trapped in the retention unit before the resistance change operation. These pre-trapped electrons are positioned to counteract metal ion diffusion that would otherwise occur spontaneously. By having the electron trap mechanism ready in advance, the system prevents unwanted resistance state changes before they happen, rather than reacting after instability occurs.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If metal ions are allowed to diffuse freely in the resistance change unit, then conduction path formation is efficient, but data retention deteriorates due to spontaneous ionization

Engineering Contradiction:
Improveconduction path formation efficiencyVSAvoiddata retention properties
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The memory structure is segmented into distinct functional units: an ion supply unit, a retention unit with electron traps, and a resistance change unit. This segmentation separates the ion diffusion function from the resistance change function, allowing efficient conduction path formation in the resistance change unit while the retention unit independently controls spontaneous ionization through trapped electrons.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The retention unit acts as an intermediary layer between the ion supply unit and the resistance change unit. It controls the flow and interaction of metal ions, allowing efficient conduction path formation when needed while preventing spontaneous ionization that would degrade data retention. The trapped electrons in the retention unit mediate the interaction to achieve both efficiency and reliability.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The retention unit with electron traps effectively suppresses electron movement, preventing conduction path ionization and enhancing data retention properties by maintaining stable resistance states.

Implementation Method 1

The retention unit is provided on the first electrode and has an electron trap

Methodology Applied
Scientific EffectElectron trapping: Electrostatic Induction

Implementation Method 2

a metal included in the ion supply unit is ionized to diffuse into the resistance change unit

Methodology Applied
Scientific EffectIonization: Ionisation

Implementation Method 3

a metal included in the ion supply unit is ionized to diffuse into the resistance change unit

Methodology Applied
Scientific EffectDiffusion: Diffusion

Implementation Method 4

a conduction path (filament) of a metal is formed between the two electrodes

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS9142774B2Nonvolatile memory device and method for manufacturing the same
Publication Date: 2015.09.22 KIOXIA CORP
  • US9142774B2 patent drawing
  • US9142774B2 patent drawing
  • US9142774B2 patent drawing

AI summary

According to one embodiment, a nonvolatile memory device includes a first electrode, a second electrode, and a memory cell provided between the first electrode and the second electrode. The memory cell includes a retention unit, a resistance change unit, and an ion supply unit. The retention unit is provided on the first electrode and has an electron trap. The resistance change unit is provided on the retention unit. The ion supply unit is provided between the resistance change unit and the second electrode and includes a metal element.