Memory Read Retry Sequencing by Defect Likelihood

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Solution Overview

Problem

Existing memory systems face inefficiencies in read retry operations due to fixed retry order methods, leading to increased latency and time consumption for error correction, especially when dealing with various types of defects in memory devices.

Innovation Solution

A memory controller and method that sorts defects based on occurrence possibilities and selects a read retry set from a read retry table in descending order of defect occurrence, optimizing the read retry operation for each storage region.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If a fixed retry order method is used for read retry operations, then the operation process is simple, but the latency and time consumption increase when addressing read errors

Engineering Contradiction:
Improveread retry timeVSAvoidread retry operation complexity
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The patent implements a dynamic read retry mechanism where the retry order is not fixed but adapted based on actual defect occurrence patterns. The controller dynamically adjusts the retry sequence by analyzing defect types and their frequencies, selecting optimal retry parameters from a table based on current error characteristics, thereby reducing latency while managing complexity through intelligent adaptation.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The patent changes the parameters of the read retry operation by maintaining multiple retry parameter sets in a read retry table, each corresponding to different defect types. Instead of using a single fixed retry configuration, the system selects and applies different parameter sets (such as different read voltages, timing parameters, or retry sequences) based on the identified defect type, optimizing the retry process for each specific error scenario.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If read retry operations are performed without sorting defects by occurrence possibility, then the process is straightforward, but the quality of service and error correction efficiency are reduced

Engineering Contradiction:
Improveerror correction efficiencyVSAvoiddefect analysis and sorting complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent performs preliminary analysis and sorting of defect types by their occurrence possibilities before executing read retry operations. By pre-establishing a read retry table that categorizes different defect types and their optimal retry parameters, and by sorting these based on occurrence frequency, the system prepares the most likely successful retry strategies in advance, improving error correction efficiency without adding significant operational complexity during the actual retry process.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS10379955B2Memory system and operating method thereof
Publication Date: 2019.08.13 SK HYNIX INC
  • US10379955B2 patent drawing
  • US10379955B2 patent drawing
  • US10379955B2 patent drawing

AI summary

A memory system may include: a memory device including a plurality of storage regions; and a controller. The controller may be coupled between a host and the memory device, and perform a read retry operation when a read error occurs in any one of the storage regions based on occurrence possibilities for a plurality of different type of defects in any one storage region where a read error occurred.