Memory Row Migration for Data Integrity in Die Cache Architectures

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Solution Overview

Problem

Die architectures face challenges in maintaining data integrity due to data errors caused by bit flips, radiation-induced errors, and noise-induced corruption, which are often addressed inefficiently with error correction mechanisms that consume valuable die real estate and resources.

Innovation Solution

A processor-based system that detects decoding errors, tracks error counts and access history for memory rows, and migrates data from high-error rows to less recently accessed rows, disabling the high-error rows temporarily to improve data integrity and reduce errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If error correction mechanisms such as ECC are employed to detect data errors, then data integrity is improved, but die real estate and system resources are consumed

Engineering Contradiction:
Improvedata integrityVSAvoiddie real estate
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The memory system performs self-diagnosis by monitoring its own error rates and automatically migrating data from high-error rows to low-error rows without external intervention. The processor identifies problematic memory rows through error counting and autonomously relocates data to maintain integrity while minimizing resource consumption.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system dynamically changes the operational parameters of memory rows by tracking error rates and selectively disabling or migrating data from rows exceeding error thresholds. This parameter-based management allows the system to adapt to changing memory conditions and maintain reliability without permanent structural modifications.

Inventive Principle:
Principle #35Parameter changes

2Reliability

If error correction mechanisms are used to detect data errors, then data integrity is improved, but device complexity increases

Engineering Contradiction:
Improvedata integrityVSAvoiderror correction mechanism complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The memory system performs self-diagnosis by monitoring its own error rates and automatically migrating data from high-error rows to low-error rows without external intervention. The processor identifies problematic memory rows through error counting and autonomously relocates data to maintain integrity while minimizing resource consumption.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system implements continuous feedback monitoring of error rates in each memory row, using this information to dynamically adjust data placement decisions. The error counting mechanism provides real-time feedback that drives the migration process, allowing the system to respond adaptively to changing memory conditions.

Inventive Principle:
Principle #23Feedback

3Quantity of substance

If memory rows with high error rates are continuously used, then memory capacity is maintained, but data corruption increases

Engineering Contradiction:
Improvememory capacityVSAvoiddata integrity
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The system dynamically changes the operational parameters of memory rows by tracking error rates and selectively disabling or migrating data from rows exceeding error thresholds. This parameter-based management allows the system to adapt to changing memory conditions and maintain reliability without permanent structural modifications.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The memory system transitions from a static to a dynamic management approach, where memory row status and data placement are continuously adjusted based on real-time error rate monitoring. The system can migrate data between rows and adapt its configuration to maintain optimal reliability while preserving total memory capacity.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS12461819B2Apparatus and methods for memory data integrity within die architectures
Publication Date: 2025.11.04 QUALCOMM INC
  • US12461819B2 patent drawing
  • US12461819B2 patent drawing
  • US12461819B2 patent drawing

AI summary

Methods and apparatuses directed to improving performance and data integrity within die architectures. In some examples, a die package includes a memory device, and a processor coupled to the memory device. The memory device may serve as a cache for another memory device. The processor receives a signal indicating that a number of errors have been detected. In response to the signal, the processor reads an error count corresponding to each of multiple memory rows of the memory device. Further, the processor determines a first memory row of the memory rows based on the error counts. The processor also determines a second memory row of the memory rows based on access data characterizing memory accesses of the plurality of rows. The processor further writes data stored at the first memory row to the second memory row of the memory device, and disables the first memory row.