Dynamic Scan Frequency Adjustment for Memory Charge Loss
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Solution Overview
Problem
Memory sub-systems face challenges in managing charge loss scan operations due to variations in operating temperature, leading to increased latency, power consumption, and bit error rates, as frequent or infrequent block family scans can result in performance reduction and read errors.
Innovation Solution
The memory sub-system adjusts the block family scan operation frequency based on operating temperature, reducing scans at lower temperatures and increasing them at higher temperatures to maintain accurate calibration and minimize errors, thereby optimizing performance and resource usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If block family scan operations are performed frequently to maintain accurate calibration, then bit error rate decreases, but latency and power consumption increase
Solution Approach 1:
The patent implements dynamic adjustment of scan operation frequency based on operating temperature. The controller monitors temperature and adapts the block family scan frequency accordingly, transitioning from static to dynamic operation. At higher temperatures where charge loss is more significant, scans are performed more frequently to maintain calibration accuracy. At lower temperatures, scan frequency is reduced to minimize latency and power consumption, thus resolving the contradiction between reliability and time loss.
Solution Approach 2:
The patent changes the operational parameter (scan frequency) based on environmental conditions (temperature). By adjusting the scan frequency parameter dynamically according to temperature measurements, the system optimizes the balance between maintaining calibration accuracy (reliability) and reducing operational overhead (latency and power consumption).
2Measurement precision
If block family scan operations are performed frequently to maintain accurate calibration, then calibration accuracy is maintained, but power consumption increases
Solution Approach 1:
The system dynamically adjusts scan frequency based on temperature conditions. The controller monitors operating temperature and adapts the block family scan frequency in real-time. At higher temperatures where charge loss accelerates and calibration accuracy degrades faster, scans are performed more frequently. At lower temperatures where charge loss is slower, scan frequency is reduced to minimize power consumption, thus resolving the contradiction between calibration accuracy and power consumption.
Solution Approach 2:
The patent changes the scan frequency parameter based on temperature measurements. By adjusting this operational parameter dynamically, the system maintains calibration accuracy when necessary (high temperature) while reducing power consumption when conditions permit (low temperature), optimizing the trade-off between measurement precision and energy usage.
3Productivity
If block family scan operations are performed infrequently to reduce latency, then processing speed improves, but bit error rate increases
Solution Approach 1:
The patent implements dynamic frequency adjustment based on temperature. The controller monitors operating temperature and adapts the block family scan frequency accordingly. At higher temperatures where charge loss is more significant, scans are performed more frequently to prevent bit errors, even though this reduces processing speed. At lower temperatures where charge loss is slower, scan frequency is reduced to improve processing speed while maintaining acceptable bit error rates, thus resolving the contradiction between productivity and reliability.
4Measurement precision
If scan frequency is increased to maintain calibration at high temperature, then calibration accuracy is maintained, but system performance decreases
Solution Approach 1:
The system dynamically adjusts scan frequency based on temperature conditions rather than using a fixed high frequency. The controller monitors operating temperature and adapts the block family scan frequency in real-time. At higher temperatures where charge loss accelerates, scans are performed more frequently to maintain calibration accuracy. At lower temperatures, scan frequency is reduced to minimize interruptions and maintain high system performance, thus resolving the contradiction between calibration accuracy and system performance through adaptive behavior.
Data Source
AI summary
A memory system includes a memory device and a processing device, operatively coupled to the memory device. The processing device performs operations comprising: identifying an operating temperature of the memory device; determining that the operating temperature satisfies a temperature condition; modifying a scan frequency parameter for performing a scan operation on representative blocks of a set of blocks in the memory device; and performing the scan operation at a frequency identified by the scan frequency parameter.