Memory Scan Scheduling with Time Offsets for Voltage Shift QoS
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Solution Overview
Problem
Existing scheduling techniques for scan operations in memory sub-systems result in uneven distributions, adversely affecting memory access operations and quality of service (QoS) due to temporal voltage shifts in memory cells.
Innovation Solution
Introduce scheduling time offsets for scan operations to evenly distribute them across scan intervals, using a scheduling time offset for each voltage offset bin to mitigate the impact of temporal voltage shifts.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If scan operations are scheduled using existing techniques, then memory devices can be monitored for temporal voltage shifts, but the distribution of scan operations becomes uneven, adversely affecting memory access operations and quality of service
Solution Approach 1:
The patent segments the schedule of scan operations into multiple intervals and distributes them unevenly across different time periods. By dividing the monitoring task into segmented scan operations with different scheduling time offsets, the system ensures comprehensive coverage of temporal voltage shifts while preventing concentration of scan operations at specific times that would impact memory access performance.
Solution Approach 2:
The patent introduces dynamic scheduling time offsets that vary for different voltage offset bins. Instead of using a fixed, uniform scan schedule, the system dynamically adjusts when scan operations occur based on the specific voltage bin being monitored. This dynamic approach allows the system to maintain reliable monitoring while distributing scan operations in a way that minimizes impact on memory access operations.
2Reliability
If scan operations are performed frequently to monitor temporal voltage shifts, then data reliability is improved, but the frequency of scan operations conflicts with memory access operations, reducing quality of service
Solution Approach 1:
The patent implements periodic scan operations with varying periods for different voltage offset bins. By using periodic action with different periods, the system can monitor temporal voltage shifts at appropriate intervals without performing scans too frequently. This allows the system to maintain data reliability through regular monitoring while ensuring sufficient time windows for memory access operations to proceed without interference.
Solution Approach 2:
The patent applies different scan operation frequencies and timing characteristics to different voltage offset bins based on their specific requirements. Instead of a uniform monitoring approach, the system tailors the scan schedule locally for each voltage bin, performing more frequent scans for bins with higher risk of temporal voltage shifts and less frequent scans for more stable bins, thereby optimizing the balance between reliability and time availability.
Data Source
AI summary
For each voltage offset bin of a plurality of voltage offset bins, a corresponding period of scan operations of memory blocks associated with the voltage offset bin is determined. For each voltage offset bin of the plurality of voltage offset bins, a corresponding scheduling time offset of scan operations is determined. For a chosen voltage offset bin, based on a period of scan operations associated with the chosen voltage offset bin and a scheduling time offset associated with the chosen voltage offset bin, a scan operation is scheduled. The scan operation with respect to one or more blocks associated with the chosen voltage offset bin is performed.