Memory Scan Timing Using Read Voltage Change Thresholds
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Memory systems face issues with retention and degradation due to unnecessary media scans after power down, leading to latency and bandwidth consumption, as existing timers do not account for dynamic changes in read voltage magnitudes.
Innovation Solution
Dynamically adjust the timing for performing media scans based on the results of a block family scan after power-on, using read voltage thresholds to determine if an immediate scan is necessary or if it can be deferred until the media scan timer is satisfied.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If media scans are performed after power down, then retention and degradation can be detected, but latency and bandwidth consumption increase
Solution Approach 1:
The patent implements dynamic scan timing adjustment based on power down duration. The media scan is scheduled conditionally: if the power down duration exceeds a threshold, the scan is deferred until after power on; otherwise, it can be performed immediately. This dynamic approach optimizes the balance between detecting retention issues and minimizing latency impact.
Solution Approach 2:
The system changes the timing parameter of media scans based on detected conditions. By monitoring power down duration and adjusting the scan schedule accordingly, the system adapts the scan timing to minimize latency while ensuring retention detection when necessary.
2Reliability
If media scans are performed after power down, then degradation can be identified, but bandwidth consumption increases
Solution Approach 1:
The patent dynamically adjusts media scan scheduling based on power down duration conditions. By conditionally deferring scans until after power on when power down exceeds a threshold, the system reduces unnecessary bandwidth consumption while maintaining degradation detection capability when truly needed.
3Extent of automation
If existing timer-based scan scheduling is used, then scan operations are automated, but dynamic changes in read voltage magnitudes are not accounted for
Solution Approach 1:
The patent implements feedback mechanisms where block family scan results (including read voltage magnitude changes) are used to adjust media scan timing. The system monitors voltage changes and feeds this information back to the scan scheduler, which then adapts the scan schedule accordingly, combining automation with adaptability to dynamic conditions.
Solution Approach 2:
The system changes scan timing parameters based on detected read voltage magnitude changes. When voltage changes exceed thresholds, the media scan schedule is adjusted to perform scans at appropriate times, making the automated scheduling system adaptable to dynamic voltage conditions.
Data Source
AI summary
Methods, systems, and devices for scan timing management for a memory system are described. A timing for performing a media scan may be dynamically adjusted based on results of a block family scan. After a memory system is powered on, the block family scan may be triggered and the memory system may use the results of the block family scan to determine whether to immediately perform the media scan. Performing the block family scan may identify read voltages, and a change in the read voltages since before the memory system was powered on. The memory system may trigger to immediately perform the media scan if the read voltages or the change in the read voltages satisfy thresholds. However, the memory system may not perform the media scan until a media scan timer is satisfied, if the read voltages and the change in the read voltages do not satisfy the thresholds.