Memory Subsystem Scan Optimization via Workload-Based Selection
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Solution Overview
Problem
Existing memory sub-systems face performance degradation due to increased latency and error rates resulting from combining multiple scan operations into a single multiple-read scan operation, particularly in workloads characterized by slower writes.
Innovation Solution
A scanning technique that dynamically selects the type of scan based on workload characteristics, using multiple-read scan operations for burst write traffic to improve throughput and single-read scan operations for slower write rates to maintain low latency and error rates.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple scan operations are combined into a single multiple-read scan operation, then throughput is improved, but latency and error rates increase
Solution Approach 1:
The system dynamically adjusts the scan operation strategy based on workload characteristics. When burst write traffic is detected, multiple-read scan operations are used to maximize throughput. When slower write rates are detected, single-read scan operations are used to maintain low latency and error rates. This dynamic adaptation resolves the contradiction by selecting the appropriate scan mode based on real-time workload conditions.
Solution Approach 2:
The system changes the operational parameters of scan operations based on workload type. For burst writes, it uses multiple-read scan operations with higher throughput parameters. For slower writes, it switches to single-read scan operations with lower latency parameters. This parameter adjustment allows the system to optimize for throughput when appropriate and for reliability when needed.
2Productivity
If multiple-read scan operations are used for burst write traffic, then throughput is improved, but latency increases for slower write workloads
Solution Approach 1:
The system dynamically selects between multiple-read and single-read scan operations based on detected workload characteristics. Burst write traffic triggers multiple-read operations to improve throughput, while slower write rates trigger single-read operations to maintain low latency. This dynamic selection resolves the contradiction by adapting the scan strategy to match the actual workload demands.
Solution Approach 2:
The system changes the scan operation parameters based on workload type. For burst writes, it uses multiple-read operations with parameters optimized for throughput. For slower writes, it uses single-read operations with parameters optimized for low latency. This parameter adaptation allows the system to achieve high throughput when needed while maintaining low latency when appropriate.
3Loss of time
If single-read scan operations are performed after each write operation, then latency is kept low, but throughput decreases for burst write workloads
Solution Approach 1:
The system dynamically adjusts the scan operation frequency and type based on workload characteristics. For slower write rates, single-read operations after each write maintain low latency. For burst write traffic, multiple-read operations are used to improve throughput. This dynamic adjustment resolves the contradiction by matching the scan strategy to the actual workload pattern.
Solution Approach 2:
The system changes the scan operation parameters based on detected workload type. For slower writes, it uses single-read operations with latency-optimized parameters. For burst writes, it switches to multiple-read operations with throughput-optimized parameters. This parameter adaptation allows the system to optimize for the appropriate metric based on actual workload conditions.
Data Source
AI summary
A method performed by a processing device receives a plurality of write operation requests, where each of the write operation requests specifies a respective one of the memory units, identifies one or more operating characteristic values, where each operating characteristic value reflects one or more memory access operations performed on a memory device, and determines whether the operating characteristic values satisfy one or more threshold criteria. Responsive to determining that the operating characteristic values satisfy the one or more threshold criteria, the method performs a plurality of write operations, where each of the write operations writes data to the respective one of the memory units, and performs a multiple-read scan operation subsequent to the plurality of write operations, where the multiple-read scan operation reads data from each of the memory units.