Memory Scrub Error Tracking and Row Reconfiguration
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Solution Overview
Problem
Memory devices face challenges in identifying and addressing rows with decreased reliability due to persistent errors during scrub operations, as they cannot accurately determine which rows are associated with error issues based on total error quantities and row-specific error counts.
Innovation Solution
The memory device stores error quantities for each row during multiple scrub operations and reconfigures the array by offlining rows with high error rates, transferring data to more reliable rows, thereby improving overall reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the memory device stores only total error quantities and row-specific error counts during scrub operations, then the error tracking mechanism is simple, but the device cannot accurately identify rows with decreased reliability
Solution Approach 1:
The patent segments the error tracking data into multiple dimensions: total error quantities, row-specific error counts, and quantities of errors detected in individual columns. This segmentation allows the system to identify problematic rows by comparing column error patterns across different rows, thereby improving measurement precision without proportionally increasing complexity.
Solution Approach 2:
The patent introduces a new dimension of analysis by tracking errors at the column level within rows. Instead of only monitoring total errors and row-level errors, the system now monitors column-specific errors, adding a dimensional layer that enables more precise identification of unreliable rows through pattern recognition across multiple dimensions.
2Reliability
If the memory device performs scrub operations on all rows, then comprehensive error detection is achieved, but time and resources are wasted on rows with normal reliability
Solution Approach 1:
The patent applies local quality by differentiating scrub operation intensity based on row characteristics. Rows identified as having decreased reliability (through the new error tracking metrics) receive more frequent or intensive scrubbing, while rows with normal reliability undergo standard scrubbing. This localized approach maintains high reliability for problematic areas while improving overall scrub operation efficiency.
Solution Approach 2:
The patent implements partial action by performing enhanced scrub operations only on rows that show signs of decreased reliability based on the multi-dimensional error tracking. Instead of uniformly applying excessive scrubbing to all rows, the system applies partial enhanced action only where needed, thereby maintaining reliability where necessary while improving productivity overall.
3Reliability
If the memory device reconfigures the array by offlining rows with high error rates, then data integrity is improved, but device complexity increases due to data transfer operations
Solution Approach 1:
The patent applies preliminary action by continuously monitoring error patterns and identifying rows with decreased reliability before they cause data integrity failures. The system proactively offlines problematic rows and transfers their data to healthy rows, preventing errors from accumulating to critical levels. This preliminary intervention reduces the urgency and complexity of emergency reconfiguration operations.
Solution Approach 2:
The patent implements self-service through automated error monitoring, row identification, data transfer, and reconfiguration operations. The memory device autonomously performs these complexity-intensive tasks without external intervention, using the multi-dimensional error tracking data to automatically determine when and where reconfiguration is needed, thereby managing device complexity through self-managed processes.
Data Source
AI summary
Methods, systems, and devices for scrub operations with row error information are described. A memory device may include a memory array with a set of rows. During a scrub operation, the memory device may read data and error control information stored in a row of the memory array and detect a quantity of errors in the row. The memory device may store the quantity of detected errors in the row of the memory device during the scrub operation in memory cells of the memory array storing data associated with the row of the memory array. In some cases, the memory device may then determine that the row is associated with a decreased reliability based on the stored quantity of errors detected in the row during the scrub operation. Here, the memory device may reconfigure the memory array to store the data of the row in another row.