Section-Based Memory Access Scheme for Leakage Charge Dissipation

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Solution Overview

Problem

Memory devices face data degradation due to leakage charge accumulation across non-selected memory cells during access operations, leading to loss of stored data, especially in ferroelectric memory cells which rely on non-linear polarization behavior.

Innovation Solution

Implementing section-based data protection by activating cell selection components in selected memory sections to dissipate accumulated leakage charge through voltage adjustment operations, where digit and plate lines are coupled with voltage sources to equalize biases, thereby preventing data loss and improving data retention.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If access operations are performed on selected memory cells, then data access functionality is enabled, but leakage charge accumulates on non-selected memory cells causing data loss

Engineering Contradiction:
Improvedata access functionalityVSAvoiddata retention
Core Design Contradiction:
Ease of operationVSReliability

Solution Approach 1:

The memory device is divided into multiple independently controllable memory sections, each with its own cell selection components. This segmentation allows voltage adjustment operations to be applied selectively to specific sections that have accumulated leakage charge, rather than requiring system-wide operations. The patent implements this by dividing the memory array into sections and providing separate control for cell selection components in each section.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements periodic voltage adjustment operations that proactively dissipate accumulated leakage charge before it causes data loss. This preliminary action prevents the harmful effect from manifesting by periodically resetting the charge accumulation state of non-selected memory cells, thereby maintaining data integrity without requiring continuous monitoring or intervention.

Inventive Principle:
Principle #10Preliminary action

2Reliability

If voltage adjustment operations are performed frequently to dissipate leakage charge, then data retention is improved, but power consumption and operational efficiency deteriorate

Engineering Contradiction:
Improvedata retentionVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent implements periodic voltage adjustment operations that dissipate leakage charge at predetermined intervals rather than continuously or on-demand. This periodic approach balances data retention requirements with power consumption by performing maintenance operations only when necessary, thereby reducing overall energy usage while maintaining data integrity.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

By segmenting the memory device into multiple independently controllable sections, the patent enables selective application of voltage adjustment operations only to sections that have accumulated significant leakage charge. This reduces the overall frequency and scope of power-consuming operations compared to system-wide adjustments, thereby lowering power consumption while maintaining data retention.

Inventive Principle:
Principle #1Segmentation

3Reliability

If section-based data protection is implemented, then data retention is improved, but device complexity increases due to additional control mechanisms

Engineering Contradiction:
Improvedata retentionVSAvoidcontrol mechanism complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements a universal voltage adjustment mechanism that can be applied to any memory section through standardized control interfaces. The cell selection components and voltage adjustment circuitry are designed to perform multiple functions: normal data access operations, leakage charge dissipation, and data protection. This multi-functionality reduces the need for separate dedicated circuits for each protection function, thereby limiting the increase in device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent merges the data access control and data protection functions into a unified control architecture. The cell selection components serve dual purposes: selecting memory cells for data access and identifying sections for voltage adjustment operations. By combining these functions and reusing existing control infrastructure, the patent minimizes the additional complexity introduced by section-based data protection mechanisms.

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach effectively mitigates data degradation by periodically dissipating leakage charge, enhancing the memory device's ability to maintain stored data and operating efficiency by reducing the frequency of voltage adjustment operations.

Implementation Method 1

access operations on selected memory cells of a section of a memory device may cause charge to accumulate on non-selected memory cells of the section of the memory device

Methodology Applied
Scientific EffectLeakage charge accumulation: Electrical Accumulator

Implementation Method 2

digit and plate lines are coupled with voltage sources to equalize biases

Methodology Applied
Scientific EffectVoltage adjustment: Electric Field

Data Source

PatentUS10665285B2Access schemes for section-based data protection in a memory device
Publication Date: 2020.05.26 MICRON TECHNOLOGY INC
  • US10665285B2 patent drawing
  • US10665285B2 patent drawing
  • US10665285B2 patent drawing

AI summary

Methods, systems, and devices for section-based data protection in a memory device are described. In one example, a memory device may include a set memory sections each having memory cells configured to be selectively coupled with access lines of the respective memory section. A method of operating the memory device may include selecting at least one of the sections for a voltage adjustment operation based on a determined value of a timer, and performing the voltage adjustment operation on the selected section by activating each of a plurality of word lines of the selected section. The voltage adjustment operation may include applying an equal voltage to opposite terminals of the memory cells, which may allow built-up charge, such as leakage charge accumulating from access operations of the selected memory section, to dissipate from the memory cells of the selected section.