Nonvolatile Memory Sensing Time Control Circuit
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Solution Overview
Problem
Nonvolatile semiconductor memory devices face reliability issues due to power noise, which can cause temporary errors, and existing methods often resort to removing memory blocks from mapping tables, rather than addressing the noise itself.
Innovation Solution
A nonvolatile memory device with a sensing time control circuit that adjusts the sensing time during read operations to reduce the influence of power noise, allowing data output operations to be performed concurrently with sensing operations, thereby improving performance without repeating sensing operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the sensing operation is performed for a fixed duration to ensure data accuracy, then the reliability of data reading is improved, but the productivity decreases when data output operations are performed concurrently
Solution Approach 1:
The sensing time control circuit dynamically adjusts the sensing time period duration based on whether a data output operation is being performed. When a data output operation is detected, the sensing time is shortened; when no data output operation is occurring, the sensing time returns to its original longer duration. This dynamic adjustment allows the system to maintain data accuracy when possible while improving throughput when concurrent operations are needed.
Solution Approach 2:
The invention changes the time parameter of the sensing operation based on operational context. The sensing time period is modified from a fixed duration to a variable duration that adapts to the presence or absence of concurrent data output operations, thereby optimizing the balance between reliability and productivity.
2Measurement precision
If the sensing time period is extended to improve data sensing accuracy, then the measurement precision is improved, but the loss of time increases when concurrent data output operations occur
Solution Approach 1:
The sensing time control circuit implements dynamic adjustment of the sensing time period duration based on the operational state. When a data output operation is detected during sensing, the duration is shortened to reduce time loss. When no concurrent operation occurs, the full sensing time is allocated to maintain measurement precision.
Solution Approach 2:
The invention applies partial sensing time when concurrent data output operations are detected, rather than requiring the full sensing time period. This partial action approach accepts reduced sensing duration in exchange for enabling concurrent operations, thereby reducing overall time loss while maintaining acceptable sensing accuracy for time-critical operations.
3Reliability
If power noise filtering is implemented to reduce errors, then the reliability is improved, but the device complexity increases
Solution Approach 1:
The sensing time control circuit performs preliminary detection of data output operations and proactively adjusts the sensing time period before the actual sensing operation begins. By anticipating potential power noise issues from concurrent operations and adjusting timing in advance, the system reduces errors without requiring complex real-time noise filtering circuitry.
Solution Approach 2:
The invention maintains continuous operation by allowing sensing and data output operations to occur concurrently with adjusted timing, rather than stopping sensing operations to filter power noise. The sensing time control circuit ensures continuous useful action by coordinating timing to minimize interference while maintaining reliability.
Data Source
AI summary
Disclosed is a nonvolatile memory device, which includes a memory cell array that includes a plurality of memory cells, a page buffer circuit that is connected with the memory cell array through a plurality of bit lines and performs a sensing operation of sensing memory cells selected from the plurality of memory cells through the plurality of bit lines during a sensing time, an input/output circuit that performs a data output operation of outputting data from the page buffer circuit to an external device through data lines, and a sensing time control circuit that adjusts the sensing time when the data output operation is performed during the sensing time.