Memory Device Temperature Sensor Dynamic Mode Selection
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Solution Overview
Problem
Existing memory devices face performance degradation due to internal temperature fluctuations, leading to potential data loss and reduced reliability, as current temperature measurement methods do not provide sufficient precision to effectively manage temperature-related operational throttling.
Innovation Solution
A memory device with a temperature sensor capable of operating in different modes, allowing for varying measurement periods and precision levels, generating a temperature code to control operations and prevent overheating, thereby enhancing reliability and performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a single temperature measurement mode is used, then the device structure is simple, but the temperature measurement precision is insufficient to manage temperature-related operational throttling
Solution Approach 1:
The temperature sensor is configured to operate in multiple operation modes (first operation mode and second operation mode) with different measurement periods. The memory controller dynamically selects between these modes based on temperature thresholds, allowing the system to adapt measurement precision to current thermal conditions. This dynamic approach enables high precision measurement when needed while maintaining system simplicity through selective mode activation.
Solution Approach 2:
The invention changes the measurement period parameter of the temperature sensor based on operational requirements. In the first operation mode, a first measurement period is used, while in the second operation mode, a second measurement period is applied. By varying this temporal parameter, the system achieves different levels of temperature measurement precision without requiring fundamentally different sensor hardware, thus resolving the contradiction between precision and complexity.
2Reliability
If temperature measurement is performed continuously with high precision, then temperature management is improved, but the operation time for data processing is reduced
Solution Approach 1:
The temperature sensor performs measurements periodically rather than continuously, with different periods depending on the operation mode. The memory controller switches between a first measurement period and a second measurement period based on temperature thresholds and operational state. This periodic measurement approach ensures adequate temperature monitoring for reliability while minimizing interruptions to data processing operations, thus balancing reliability and productivity.
Solution Approach 2:
The measurement period is dynamically adjusted based on the current operational context. When temperature thresholds are exceeded or specific operational conditions arise, the system transitions to a measurement mode with appropriate periodicity. This dynamic adjustment ensures that temperature management maintains sufficient reliability while allowing maximum data processing time during normal operation, resolving the contradiction between these two objectives.
3Measurement precision
If the temperature sensor operates in a long measurement mode, then measurement precision is improved, but the operation time for other tasks is reduced
Solution Approach 1:
The system dynamically selects between a first operation mode with a first measurement period and a second operation mode with a second measurement period. This dynamic mode selection allows the system to use longer measurement periods (and thus higher precision) only when necessary, while maintaining shorter measurement periods during normal operation to preserve data processing time. The memory controller makes real-time decisions about which mode to use based on temperature thresholds and operational requirements.
Solution Approach 2:
The measurement period parameter is changed based on operational needs. Rather than using a fixed long measurement period that would constantly reduce data processing time, the system varies this parameter between a first measurement period and a second measurement period. This parameter change strategy enables high precision measurement when temperature management is critical while minimizing time loss for data processing during normal operations.
Data Source
AI summary
The present disclosure relates to a semiconductor system including a semiconductor device and a controller. The semiconductor device outputs a temperature code corresponding to an internal temperature thereof. The controller controls, based on the temperature code, the semiconductor device to set a temperature measurement mode among at least two temperature measurement modes having different temperature measurement periods and to measure the internal temperature in the set temperature measurement mode.