Memory System Signal Monitoring via Hibernate Mode Testing

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Solution Overview

Problem

Current memory systems face challenges in performing signal quality tests during normal operation modes, leading to increased signaling overhead and latency, as they typically require diagnostic modes that are not always feasible.

Innovation Solution

A memory system configured to perform signal quality tests during normal operation by selecting input parameters, storing voltage values, and incrementing them during hibernate modes, allowing for reduced latency and improved performance by minimizing signaling overhead.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If signal quality tests are performed during normal operation mode, then measurement precision is improved, but signaling overhead and latency increase

Engineering Contradiction:
Improvesignal quality test accuracyVSAvoidlatency
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The memory system performs signal quality tests during hibernate mode before normal operation resumes, allowing measurements to be taken in advance. The controller enters hibernate mode, executes the signal quality test on the interface, and stores results before returning to normal operation, thereby eliminating the need to perform tests during active data transmission

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system implements a feedback mechanism where the controller monitors its own operational state and automatically initiates signal quality tests when transitioning to hibernate mode. The test results are stored and can be used to adjust operational parameters, creating a closed-loop system that continuously monitors and optimizes signal quality without impacting normal operation

Inventive Principle:
Principle #23Feedback

2Measurement precision

If signal quality tests are performed during normal operation mode, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improvesignal quality test accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The memory controller is designed to perform multiple functions: normal data processing, state management (active/hibernate transitions), and signal quality testing. By making the controller multi-functional, the patent avoids adding separate dedicated testing hardware, thereby reducing overall system complexity while still enabling comprehensive signal quality measurements

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The signal quality test functionality is merged with the existing controller operations. The controller combines data processing tasks with signal quality monitoring in a unified architecture, eliminating the need for separate testing subsystems and reducing inter-component complexity

Inventive Principle:
Principle #5Merging (Combining)

3Reliability

If signal quality tests are performed during normal operation mode, then reliability is improved, but productivity decreases

Engineering Contradiction:
Improvesignal quality assuranceVSAvoidoperational efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The system performs signal quality tests periodically during hibernate mode transitions rather than continuously during normal operation. This periodic testing approach ensures signal quality is verified at regular intervals when the system is already transitioning states, maintaining reliability without continuously impacting productivity during active data processing

Inventive Principle:
Principle #19Periodic action

Data Source

PatentUS20250004939A1Signal monitoring by a memory system
Publication Date: 2025.01.02 MICRON TECHNOLOGY INC
  • US20250004939A1 patent drawing
  • US20250004939A1 patent drawing
  • US20250004939A1 patent drawing

AI summary

Methods, systems, and devices for signal monitoring by a memory system are described. A memory system may receive signaling (e.g., from a host system) and may sample the signal and generate an eye diagram. During a normal mode of operation, the memory system monitor characteristics of the eye diagram to improve signaling. The memory system may determine a voltage level of the signaling based on one or more input parameters and sampling times associated with the signaling. An indication of the voltage level of the signaling may be stored (e.g., to a register of the memory system) and may be periodically transmitted to the host system.